Growth and characterization of a kind of nitrogen-rich niobium nitride for bolometer applications at terahertz frequencies

Chinese Physics Letters

Volumn 25, Issue 11, 2008, Pages 4076-4078

  Lu, Xue Hui ^a   Kang, Lin ^a   Zhou, Lei ^a   Chen, Jian ^a   Ji, Zheng Ming ^a   Cao, Chun Hai ^a   Jin, Biao Bing ^a   Xu, Wei Wei ^a   Wu, Pei Heng ^a   Wang, Xiao Shu ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BOLOMETERS; INFRARED DETECTORS; NITROGEN COMPOUNDS; SURFACE ROUGHNESS; TEMPERATURE; X RAY DIFFRACTION;

CRYSTALLINE SILICON SUBSTRATES; GASES MIXTURE; PERFORMANCE; PHOTOELECTRONIC SPECTROSCOPY; SINGLE CRYSTALLINE SILICON; TEMPERATURE COEFFICIENTS OF RESISTANCE; TERAHERTZ FREQUENCIES; THICK SAMPLES; THIN-FILMS; TOTAL PRESSURE;

NIOBIUM COMPOUNDS;

EID: 58449110323     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/25/11/065     Document Type: Article

References (13)

1. Richards P L 1994 J. Appl. Phys. 76 12
2. Myers M J et al 2005 IEEE Trans. Appl. Supercond. 2 564
3. Baselmans J J A et al 2005 IEEE Trans. Appl. Supercond. 2 484
4. Nahum M and Martinis J M 1993 Appl. Phys. Lett. 63 22
5. Bourgeois O et al 2006 Rev. Sci. Instrum. 77 126108-1
6. Querlioz D et al 2005 Appl. Phys. Lett. 87 221901
7. 1997 Periodic Table SE v3.5 (SMI Corporation, Tulsa, USA)
8. Tyutyunnik A et al 1998 J. Alloys Compd. 278 83
9. Terao N 1971 J. Less-Common Met. 23 159
10. Jouve G et al 1996 Thin Solid Films 287 146
11. Kang L et al 2003 Supercond. Sci. Technol. 16 1417
12. Darlinski A et al 1987 Surf. Interface Anal. 10 223
13. NIST 2007 X-ray Photoelectron Spectroscopy Database v3.5 (USA)