Aberration-corrected microscopy for structural biology applications

Journal of Microscopy

Volumn 233, Issue 1, 2009, Pages 170-177

  Ziegler, A ^a   Rockel, B ^a   Hegerl, R ^a   Freitag, B ^b   Lucken U ^b   Plitzko, J M ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

^b Thermo Fisher Scientific   (United States)

Author keywords

Cs correction; Negative stain

Indexed keywords

TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION-CORRECTED MICROSCOPIES; BIOLOGICAL SAMPLES; CS CORRECTION; DEFOCUS; MACROMOLECULAR COMPLEXES; NEGATIVE STAIN; S CORRECTION; STRUCTURAL BIOLOGY; STRUCTURAL STUDIES; TRANSMISSION ELECTRON;

IMAGE RESOLUTION;

ARTICLE; BIOLOGY; CONTRAST; ELECTRON MICROSCOPE; IMAGE ANALYSIS; IMAGE QUALITY; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY;

EID: 58449097052     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.03106.x     Document Type: Article

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