Interface study by dual-beam FIB-TEM in a pressureless infiltrated Al(Mg)-Al2O3 interpenetrating composite

Journal of Microscopy

Volumn 233, Issue 1, 2009, Pages 132-139

  Chang, H ^a   Higginson, R L ^a   Binner, J G P ^a  

^a LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

Interpenetrating composite; Pressureless infiltration; TEM

Indexed keywords

ALUMINA; ALUMINUM ALLOYS; ALUMINUM NITRIDE; ALUMINUM OXIDE; CERAMIC MATERIALS; FOAMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; III-V SEMICONDUCTORS; INTERFACES (MATERIALS); ION BEAMS; LIQUID METALS; SILICON CARBIDE; WETTING;

CERAMIC PHASE; DUAL-BEAM; INFILTRATION MECHANISMS; INTERFACE STUDIES; INTERPENETRATING COMPOSITES; METAL-CERAMIC INTERFACE; PRESSURELESS; PRESSURELESS INFILTRATION; PRESSURELESS INFILTRATION TECHNIQUE; TEM;

MAGNESIUM ALLOYS;

ALLOY; ALUMINUM; ALUMINUM OXIDE; MAGNESIUM; MAGNESIUM SILICATE; METAL;

ARTICLE; CERAMICS; CHEMICAL REACTION; FOAM; FOCUSED ION BEAM TRANSMISSION ELECTRON MICROSCOPY; INTERFACE PRESSURE; PRIORITY JOURNAL; SCANNING ELECTROCHEMICAL MICROSCOPY; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY; WETTABILITY; X RAY ANALYSIS; X RAY DIFFRACTION;

EID: 58449089239     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.03103.x     Document Type: Article

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