Valences analysis of cupper by XPS and X-ray induced auger spectroscopy

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis

Volumn 16, Issue 3, 1996, Pages 122-123

  Li, Xinglin ^a   Zhang, Ruifeng ^a,b,c,d,e,f  

^a CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY   (China)

^b JILIN UNIVERSITY   (China)

^c Chinese Vacuum Society   (China)

^d Chinese Chemistry Society

^e Chinese Chemistry Society ^*

^f Chinese Instrument Society

Author keywords

Auger signal; Electron spectroscopy; Shake up peak; Valences of cupper

Indexed keywords

EID: 5844248895     PISSN: 10000593     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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