The effect of Ag addition on the optical properties of Se 90 Te 10 films

Applied Surface Science

Volumn 255, Issue 8, 2009, Pages 4590-4594

  Bekheet, A E ^a   Hegab, N A ^a   Afifi, M A ^a   Atyia, H E ^a   Sharaf, E R ^a  

^a Ain Shams University   (Egypt)

Author keywords

Energy gap; Optical constants

Indexed keywords

DRY CLEANING; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY GAP; OPTICAL CONSTANTS; REFRACTIVE INDEX; SELENIUM COMPOUNDS; SILVER; SUBSTRATES; TELLURIUM COMPOUNDS; THERMAL EVAPORATION; THIN FILMS; X RAY DIFFRACTION;

ABSORPTION CO-EFFICIENT; ABSORPTION INDEXES; CLEAN GLASS SUBSTRATES; ENERGY DISPERSIVE X RAY SPECTROSCOPY; HIGH-FREQUENCY DIELECTRICS; INDIRECT TRANSITION; OPTICAL PARAMETER; THERMAL EVAPORATION TECHNIQUE;

OPTICAL FILMS;

EID: 58349118085     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.11.080     Document Type: Article

References (37)

1. Shimakawa K. Philos. Mag. 46 (1982) 123
2. Shukal R.K., Swarup S., Kumar A., and Nigam A.N. Phys. Stat. Sol. 115 (1989) k105
3. Venugopal R.K.J., and Bhatnagar A.K. J. Phys. D: Appl. Phys. 25 (1992) 1810
4. Cheug L., Foley G.M.T., Fouria D., and Springett B.E. Photogr. Sci. Eng. 26 (1982) 245
5. Yang H., Wang W., and Min S. J. Non-Cryst. Solids 80 (1986) 503
6. Al-Ghamdi A.A. Vacuum 80 (2006) 400
7. Tanaka K. J. Non-Cryst. Solids 164-166 (1993) 1179
8. Wagner T., Jilkova R., Frumar M., and Vicek M. Int. J. Electron. 77 (1994) 185
9. Tanaka K., Itoh M., Yoshida N., and Ohto M. J. Appl. Phys. 78 (1995) 3895
10. Kawaguchi T., Maruno S., and Elliott S.R. J. Appl. Phys. 79 (1996) 9096
11. Ohto M. Phys. Stat. Sol. A 159 (1997) 461
12. Wagner T., Frumar M., and Suskova V. J. Non-Cryst. Solids 128 (1991) 197
13. Wagner T. J. Optoelectron. Adv. Mater. 4 3 (2002) 717
14. Ramesh K., Asokan S., Sangunni K.S., and Gopal E.S.R. J. Phys. Chem. Solids 61 (2000) 95
15. Frumar M., Cernosek Z., Jedelsky J., Frumarova B., and Wagner T. J. Optoelectron. Adv. Mater. 3 (2001) 177
16. Zhou G.F. Mater. Sci. Eng. A 304-306 (2001) 73
17. Chou L.H., Chang Y.Y., Chai Y.C., and Wang S.Y. J. Appl. Phys. Part 1 40 (2001) 4924
18. Wagner T., Frumar M., Kasap S.O., Vlcek Mir., and Vlcek Mil. J. Optoelectron. Adv. Mater. 3 (2001) 227
19. Gutwirth J., Wagner T., Kohoutek T., Vlcek Mir., Schroeter S., Kovanda V., Vlcek M., and Frumar M. J. Optoelectron. Adv. Mater. 5 (2003) 1139
20. Mehta N., and Kumar A. Mater. Chem. Phys. 96 (2006) 73
21. Mitkova M., and Boncheva-Mladenova Z. Monatsh. Chem. 120 (1989) 643
22. Kumar S., Husain M., and Zulfequar M. Physica B 371 (2006) 193
23. Tolansky A. Introduction to Interferometry (1951), Longman, New York
24. Murmann M. Z. Phys. 80 (1933) 161 (ibid 101(1936)643)
25. Swanepoel R. J. Phys. E: Sci. Instrum. 16 (1983) 1214
26. Zemel J.N., Jensen J.D., and Schoolar R.B. Phys. Rev. A 140 (1965) 330
27. Lee P.A., Said G., Davis R., and Lim L.T. J. Phys. Chem. Solids 30 (1969) 2719
28. Wemple S.H., and Didomenico M. Phys. Rev. B 7 (1973) 3767
29. Wemple S.H., and Didomenico M. Phys. Rev. B 3 (1971) 1338
30. Didomenico M., and Wemple S.H. J. Appl. Phys. 40 (1969) 720
31. Tauc J. In: Tauc J. (Ed). Amorphous and Liquid Semiconductors (1974), Plenum, New York 159
32. Olley J. Solid State Commun. 13 (1973) 1437
33. Chopra K.L. In: Chopra K.L. (Ed). Optical Behaviour of Materials (1972), Thomson Press, India 330
34. Urbach F. Phys. Rev. 92 (1953) 1324
35. Ilyas M., Zulfequar M., and Husain M. J. Mod. Opt. 47 (2000) 663
36. Nang T.T., Okuda M., Matsushita T., Yokota S., and Suzuki A. Jpn. J. Appl. Phys. 14 (1976) 849
37. Mott N.F., and Davis E.A. Electronics Processes in Non-Crystalline Materials (1979), Oxford, Clarendon p. 428