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Volumn 1, Issue , 2007, Pages 97-101

Integrating root cause analysis methodologies

Author keywords

[No Author keywords available]

Indexed keywords


EID: 58349111304     PISSN: 14435454     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (7)
  • 1
    • 1242321958 scopus 로고    scopus 로고
    • Butterworth- Heinemann, Woburn MA, USA. ISBN 0-7506-7158-0
    • Mobley, R.Keith. Root cause failure analysis (1999). Butterworth- Heinemann, Woburn MA, USA. ISBN 0-7506-7158-0.
    • (1999) Root cause failure analysis
    • Mobley1    Keith, R.2
  • 2
    • 58349104279 scopus 로고    scopus 로고
    • DOE-NE-STD-1004-92, DOE Guideline, Root Cause Analysis Guidance Document (1992), US Department of Energy, Office of Nuclear Energy, Washington DC, USA.
    • DOE-NE-STD-1004-92, DOE Guideline, Root Cause Analysis Guidance Document (1992), US Department of Energy, Office of Nuclear Energy, Washington DC, USA.
  • 4
    • 58349093447 scopus 로고    scopus 로고
    • BS5760: Part 7: 1991, Reliability of systems, equipment and components, Part 7. Guide to fault tree analysis
    • BS5760: Part 7: 1991, Reliability of systems, equipment and components, Part 7. Guide to fault tree analysis.
  • 5
    • 58349094661 scopus 로고    scopus 로고
    • Barrier Analysis (1995). Technical Research and Analysis Centre, Scientech, Inc. Idaho Falls, ID, USA. SCIE-DOE-01-TRAC-29-95.
    • Barrier Analysis (1995). Technical Research and Analysis Centre, Scientech, Inc. Idaho Falls, ID, USA. SCIE-DOE-01-TRAC-29-95.
  • 6
    • 58349114591 scopus 로고    scopus 로고
    • N.W. Knox and R.W.Eicher (1983). Mort Users Manual, SSDC-4, Rev.2, System Safety Development Centre, EG&G, Idaho, ID, USA.
    • N.W. Knox and R.W.Eicher (1983). Mort Users Manual, SSDC-4, Rev.2, System Safety Development Centre, EG&G, Idaho, ID, USA.
  • 7
    • 0004209592 scopus 로고    scopus 로고
    • Apollonian Publications, Yakima, Washington, USA. ISBN 1-883677-01-7
    • Gano, Dean L. (1999). Apollo Root Cause Analysis. Apollonian Publications, Yakima, Washington, USA. ISBN 1-883677-01-7.
    • (1999) Apollo Root Cause Analysis
    • Gano, D.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.