Optical characterization of stereolithography alumina suspensions using the Kubelka-Munk model

Journal of the European Ceramic Society

Volumn 29, Issue 5, 2009, Pages 919-924

  Abouliatim, Y ^a,b   Chartier, T ^a   Abelard, P ^a   Chaput, C ^b   Delage, C ^b  

^a UNIVERSITY OF LIMOGES   (France)

^b CTTC   (France)

Author keywords

Alumina; Kubelka Munk; Scattering; Stereolithography

Indexed keywords

SCATTERING; STEREOLITHOGRAPHY; SUSPENSIONS (COMPONENTS); ULTRAVIOLET RADIATION;

ALUMINA SUSPENSIONS; DIFFUSE REFLECTANCE MEASUREMENTS; KUBELKA-MUNK; MULTIPLE LIGHT SCATTERINGS; OPTICAL CHARACTERIZATIONS; PENETRATION DEPTHS; SCATTERING COEFFICIENTS; UV RADIATIONS;

ALUMINA;

EID: 58349094734     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2008.07.008     Document Type: Article

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