Investigation of dielectric and electrical behavior in Pb(Fe0.66W0.33)0.50Ti0.50O3 thin films by impedance spectroscopy

Journal of Alloys and Compounds

Volumn 469, Issue 1-2, 2009, Pages 433-440

  Kumar, Ashok ^a   Murari, N M ^a   Katiyar, R S ^a  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

Ferroelectric phase transition; Impedance spectroscopy; Modulus spectroscopy; Thin films

Indexed keywords

CERAMIC CAPACITORS; CHARGE CARRIERS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CURIE TEMPERATURE; DIELECTRIC MATERIALS; DIELECTRIC SPECTROSCOPY; DIELECTRIC WAVEGUIDES; DIFFRACTION; FERROELECTRIC DEVICES; FERROELECTRIC FILMS; FERROELECTRIC MATERIALS; FERROELECTRICITY; FILMS; GRAIN BOUNDARIES; HOLOGRAPHIC INTERFEROMETRY; LEAD; LEAD ALLOYS; PERMITTIVITY; POLYDISPERSITY; SEMICONDUCTING SILICON COMPOUNDS; SOLIDS; SPECTROSCOPY; THIN FILMS;

AC CONDUCTIVITIES; CHEMICAL SOLUTION DEPOSITION TECHNIQUES; CONDUCTION MECHANISMS; DEGREE OF RELAXATIONS; DIELECTRIC CONSTANTS; ELECTRICAL BEHAVIORS; ELEVATED TEMPERATURES; FERROELECTRIC PHASE TRANSITION; FREQUENCY DISPERSIONS; FREQUENCY INDEPENDENTS; FREQUENCY REGIONS; HIGHER FREQUENCIES; HIGHER TEMPERATURES; HOPPING FREQUENCIES; IMAGINARY PARTS; IMPEDANCE SPECTROSCOPY; JONSCHER'S POWER LAWS; LONG-RANGE ORDERINGS; MOBILE CHARGE CARRIERS; MODULUS SPECTROSCOPY; POLYCRYSTAL LINES; RELAXATION MECHANISMS; ROOM TEMPERATURES; SPACE CHARGES; TEMPERATURE DEPENDENTS; TEMPERATURE RANGES; TETRAGONAL CRYSTAL STRUCTURES;

PHASE TRANSITIONS;

EID: 58249144252     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.01.130     Document Type: Article

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