The frontiers of microscopy

Materials Today

Volumn 11, Issue SUPPL., 2008, Pages 8-11

  Midgley, P A ^a   Durkan, C ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

SCANNING PROBE MICROSCOPY;

ATOMIC SCALES; COMPLEX OBJECTS; ELECTRON MICROSCOPY.; HIGHER RESOLUTIONS; NANOTECHNOLOGY REVOLUTIONS; SCANNING PROBES;

ATOMIC PHYSICS;

EID: 58249140921     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(09)70002-1     Document Type: Article

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