Interfacial forces between silica surfaces measured by atomic force microscopy

Journal of Environmental Sciences

Volumn 21, Issue 1, 2009, Pages 30-34

  DUAN, Jinming ^a  

^a XI'AN UNIVERSITY OF ARCHITECTURE AND TECHNOLOGY   (China)

Author keywords

colloid probe; DLVO theory; interfacial interactions; solvation forces

Indexed keywords

ATOMIC FORCES; COLLOID PROBE; COLLOIDAL PARTICLES; COLLOIDAL SYSTEMS; CONSTANT CHARGES; CONSTANT POTENTIALS; DERJAGUIN , LANDAU , VERWEY , AND OVERBEEK; DLVO THEORY; HYDROPHILIC SURFACES; INTERFACIAL FORCES; INTERFACIAL INTERACTIONS; INTERFACIAL PHENOMENONS; IONIC CONCENTRATIONS; MEASURED RESULTS; MODERN INSTRUMENTATIONS; MOLECULAR FORCES; RESULTANT FORCES; SEPARATION DISTANCES; SILICA PARTICLES; SILICA SURFACES; SOLVATION FORCES; WAFER SURFACES;

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; COLLOID CHEMISTRY; FLOW INTERACTIONS; FUNCTIONS; IONIZATION OF LIQUIDS; OXIDES; SILICA; SOLVATION; VAN DER WAALS FORCES;

COLLOIDS;

SILICON DIOXIDE; WATER;

ATOMIC FORCE MICROSCOPY; COLLOID; INTERFACE; SILICA; SURFACE TENSION;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; COLLOID; PH; SURFACE PROPERTY;

COLLOIDS; HYDROGEN-ION CONCENTRATION; MICROSCOPY, ATOMIC FORCE; SILICON DIOXIDE; SURFACE PROPERTIES; WATER;

EID: 58249107349     PISSN: 10010742     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1001-0742(09)60007-3     Document Type: Article

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