Computer-controlled high-temperature single-crystal X-ray diffraction experiments and temperature calibration

Journal of Applied Crystallography

Volumn 42, Issue 1, 2009, Pages 140-142

  Krüger, Hannes ^a   Breil, Ludger ^b  

^a UNIVERSITY OF INNSBRUCK   (Austria)

^b Stoe and Cie GmbH   (Germany)

Author keywords

Computer controlled experiments; High temperature; Temperature calibration; X ray diffraction

Indexed keywords

EID: 58249102939     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889808035607     Document Type: Short Survey

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