Spectroscopic ellipsometry study of ZnO films grown on silicon substrate

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 9, 2008, Pages 3128-3131

  Lin, Keh Moh ^a   Chou, Keng Yu ^a   Chen, Po Ming ^a  

^a SOUTHERN TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AZO FILMS; CAUCHY MODEL; FITTING RESULTS; MICROSTRUCTURE PROPERTIES; MODELING STRATEGY; OSCILLATOR MODEL; SEM; SILICON SUBSTRATES; ZNO; ZNO FILMS;

LIGHT REFRACTION; MICROSTRUCTURE; ORGANIC POLYMERS; OSCILLATORS (MECHANICAL); REFRACTIVE INDEX; REFRACTOMETERS; SPECTROSCOPIC ELLIPSOMETRY; ZINC OXIDE;

SPONTANEOUS EMISSION;

EID: 58149496913     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200779265     Document Type: Conference Paper

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