-
1
-
-
29344440042
-
-
0002-7863 10.1021/ja0567081.
-
S. -J. Yu, M. -W. Kang, H. -C. Chang, K. -M. Chen, and Y. -C. Yu, J. Am. Chem. Soc. 0002-7863 10.1021/ja0567081 127, 17604 (2005).
-
(2005)
J. Am. Chem. Soc.
, vol.127
, pp. 17604
-
-
Yu, S.-J.1
Kang, M.-W.2
Chang, H.-C.3
Chen, K.-M.4
Yu, Y.-C.5
-
2
-
-
38049176593
-
-
1530-6984 10.1021/nl0716303.
-
F. Neugart, A. Zappe, F. Jelezko, C. Tietz, J. P. Boudou, A. Krueger, and J. Wrachtrup, Nano Lett. 1530-6984 10.1021/nl0716303 7, 3588 (2007).
-
(2007)
Nano Lett.
, vol.7
, pp. 3588
-
-
Neugart, F.1
Zappe, A.2
Jelezko, F.3
Tietz, C.4
Boudou, J.P.5
Krueger, A.6
Wrachtrup, J.7
-
3
-
-
33846499787
-
-
0027-8424 10.1073/pnas.0605409104.
-
C. -C. Fu, H. -Y. Lee, K. Chen, T. -S. Lim, H. -Y. Wu, P. -K. Lin, P. -K. Wei, P. -H. Tsao, H. -C. Chang, and W. Fann, Proc. Natl. Acad. Sci. U.S.A. 0027-8424 10.1073/pnas.0605409104 104, 727 (2007).
-
(2007)
Proc. Natl. Acad. Sci. U.S.A.
, vol.104
, pp. 727
-
-
Fu, C.-C.1
Lee, H.-Y.2
Chen, K.3
Lim, T.-S.4
Wu, H.-Y.5
Lin, P.-K.6
Wei, P.-K.7
Tsao, P.-H.8
Chang, H.-C.9
Fann, W.10
-
4
-
-
43449115377
-
-
1748-3387 10.1038/nnano.2008.99.
-
Y. -R. Chang, H. -Y. Lee, K. Chen, C. -C. Chang, D. -S. Tsai, C. -C. Fu, T. -S. Lim, Y. -K. Tzeng, C. -Y. Fang, C. -C. Han, H. -C. Chang, and W. Fann, Nat. Nanotechnol. 1748-3387 10.1038/nnano.2008.99 3, 284 (2008).
-
(2008)
Nat. Nanotechnol.
, vol.3
, pp. 284
-
-
Chang, Y.-R.1
Lee, H.-Y.2
Chen, K.3
Chang, C.-C.4
Tsai, D.-S.5
Fu, C.-C.6
Lim, T.-S.7
Tzeng, Y.-K.8
Fang, C.-Y.9
Han, C.-C.10
Chang, H.-C.11
Fann, W.12
-
5
-
-
36749082903
-
-
1530-6984 10.1021/nl0719271.
-
J. R. Rabeau, A. Stacey, A. Rabeau, S. Prawer, F. Jelezko, I. Mirza, and J. Wrachtrup, Nano Lett. 1530-6984 10.1021/nl0719271 7, 3433 (2007).
-
(2007)
Nano Lett.
, vol.7
, pp. 3433
-
-
Rabeau, J.R.1
Stacey, A.2
Rabeau, A.3
Prawer, S.4
Jelezko, F.5
Mirza, I.6
Wrachtrup, J.7
-
6
-
-
35148885794
-
-
1089-5639 10.1021/jp073938o.
-
T. -L. Wee, Y. -K. Tzeng, C. -C. Han, H. -C. Chang, W. Fann, J. -H. Hsu, K. -M. Chen, and Y. -C. Yu, J. Phys. Chem. A 1089-5639 10.1021/jp073938o 111, 9379 (2007).
-
(2007)
J. Phys. Chem. A
, vol.111
, pp. 9379
-
-
Wee, T.-L.1
Tzeng, Y.-K.2
Han, C.-C.3
Chang, H.-C.4
Fann, W.5
Hsu, J.-H.6
Chen, K.-M.7
Yu, Y.-C.8
-
7
-
-
0003707065
-
-
in, EMIS Datareviews Series No. 9, edited by G. Davies (INSPEC, Institution of Electrical Engineers, London), Cha.
-
S. C. Rand, in Properties and Growth of Diamond, EMIS Datareviews Series No. 9, edited by, G. Davies, (INSPEC, Institution of Electrical Engineers, London, 1994), Chap..
-
(1994)
Properties and Growth of Diamond
-
-
Rand, S.C.1
-
8
-
-
0033330113
-
-
0921-4526 10.1016/S0921-4526(99)00398-1.
-
G. Davies, Physica B 0921-4526 10.1016/S0921-4526(99)00398-1 273, 15 (1999).
-
(1999)
Physica B
, vol.273
, pp. 15
-
-
Davies, G.1
-
9
-
-
3543054152
-
-
0031-9007 10.1103/PhysRevLett.85.290.
-
C. Kurtsiefer, S. Mayer, P. Zarda, and H. Weinfurter, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.85.290 85, 290 (2000).
-
(2000)
Phys. Rev. Lett.
, vol.85
, pp. 290
-
-
Kurtsiefer, C.1
Mayer, S.2
Zarda, P.3
Weinfurter, H.4
-
10
-
-
0035675782
-
-
1050-2947 10.1103/PhysRevA.64.061802.
-
A. Beveratos, R. Brouri, T. Gacoin, J. -P. Poizat, and P. Grangier, Phys. Rev. A 1050-2947 10.1103/PhysRevA.64.061802 64, 061802 (2001).
-
(2001)
Phys. Rev. A
, vol.64
, pp. 061802
-
-
Beveratos, A.1
Brouri, R.2
Gacoin, T.3
Poizat, J.-P.4
Grangier, P.5
-
11
-
-
41549166573
-
-
0146-9592 10.1364/OL.33.000611.
-
Y. Sonnefraud, A. Cuche, O. Faklaris, J. -P. Boudou, T. Sauvage, J. -F. Roch, F. Treussart, and S. Huant, Opt. Lett. 0146-9592 10.1364/OL.33.000611 33, 611 (2008).
-
(2008)
Opt. Lett.
, vol.33
, pp. 611
-
-
Sonnefraud, Y.1
Cuche, A.2
Faklaris, O.3
Boudou, J.-P.4
Sauvage, T.5
Roch, J.-F.6
Treussart, F.7
Huant, S.8
-
12
-
-
29744458375
-
-
0003-6951 10.1063/1.2103389.
-
J. Meijer, B. Burchard, M. Domhan, C. Wittmann, T. Gaebel, I. Popa, F. Jelezko, and J. Wrachtrup, Appl. Phys. Lett. 0003-6951 10.1063/1.2103389 87, 261909 (2005).
-
(2005)
Appl. Phys. Lett.
, vol.87
, pp. 261909
-
-
Meijer, J.1
Burchard, B.2
Domhan, M.3
Wittmann, C.4
Gaebel, T.5
Popa, I.6
Jelezko, F.7
Wrachtrup, J.8
-
13
-
-
0037108803
-
-
0003-2700 10.1021/ac025730z.
-
K. D. Weston, M. Dyck, P. Tinnefeld, C. Muller, D. P. Herten, and M. Sauer, Anal. Chem. 0003-2700 10.1021/ac025730z 74, 5342 (2002).
-
(2002)
Anal. Chem.
, vol.74
, pp. 5342
-
-
Weston, K.D.1
Dyck, M.2
Tinnefeld, P.3
Muller, C.4
Herten, D.P.5
Sauer, M.6
-
14
-
-
58149523506
-
-
Simulations for 8 (N-V) - centers per FND yielded 〈 Ne 〉 =6.7±0.2 for 20 particles, compared to 〈 Ne 〉 =6.72±0.01 for 5000 particles, indicating that the simulation achieves convergent as low as 20 sampling particles.
-
Simulations for 8 (N-V)-centers per FND yielded 〈 Ne 〉 =6.7±0.2 for 20 particles, compared to 〈 Ne 〉 =6.72±0.01 for 5000 particles, indicating that the simulation achieves convergent as low as 20 sampling particles.
-
-
-
-
15
-
-
29144452908
-
-
1077-260X 10.1109/JSTQE.2005.857738.
-
S. Fore, T. A. Laurence, Y. Yeh, R. Balhorn, C. W. Hollars, M. Cosman, and T. Huser IEEE J. Sel. Top. Quantum Electron. 1077-260X 10.1109/JSTQE.2005. 857738 11, 873 (2005).
-
(2005)
IEEE J. Sel. Top. Quantum Electron.
, vol.11
, pp. 873
-
-
Fore, S.1
Laurence, T.A.2
Yeh, Y.3
Balhorn, R.4
Hollars, C.W.5
Cosman, M.6
Huser, T.7
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