Al and Si K absorption edges of Al2SiO5 polymorphs using the new YB66 soft X-ray monochromator

Physica B: Physics of Condensed Matter

Volumn 208-209, Issue C, 1995, Pages 555-556

  Froba M ^a   Wong, Joe ^a   Rowen, M ^b   Brown Jr , G E ^c   Tanaka, T ^d   Rek, Z ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c STANFORD UNIVERSITY   (United States)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 58149326332     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(94)00748-K     Document Type: Article

References (10)

1. Refinement of the crystal structure of sillimanite*
2. Refinement of the crystal structure of andalusite
3. Refinement of the crystal structure of kyanite*
4. SSRL Activity Report
5. Correlation of multiple scattering features in XANES spectra of Al and Si K edges to the AlOSi bond angle in aluminosilicate sodalites: An empirical study
6. X-ray absorption near edge structure of quartz. Application to the structure of densified silica