Fullerene C60-silver nanoparticles hybrid structures: Optical and photoelectric characterization

Journal of Nanoscience and Nanotechnology

Volumn 8, Issue 11, 2008, Pages 5958-5965

  Dmitruk, N L ^a   Borkovskaya, O Yu ^a   Mamykin, S V ^a   Naumenko, D O ^a   Berezovska, N I ^a,b   Dmitruk, I M ^b   Meza Laguna, V ^c   Alvarez Zauco, E ^c   Basiuk, E V ^c,d  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^b TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

^c UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^d UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

1,8 diaminooctane; Characterization; Optical; Photoelectric; Silver nanoparticles; Thin films

Indexed keywords

CROSSLINKING; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; ENERGY GAP; FULLERENES; METAL NANOPARTICLES; PHOTOCURRENTS; PHOTOELECTRICITY; SILVER NANOPARTICLES;

1 ,8-DIAMINOOCTANE; ABSORPTION CO-EFFICIENT; CHEMICAL FUNCTIONALIZATION; INTERNAL QUANTUM EFFICIENCY; OPTICAL; PHOTOCURRENT SPECTRUM; PHOTOELECTRIC; PHOTOELECTRIC PROPERTY;

THIN FILMS;

C60 CARBOXYFULLERENE; CARBOXYLIC ACID; FULLERENE DERIVATIVE; NANOMATERIAL; SILVER;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; LIGHT; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; PHOTOCHEMISTRY; RADIATION SCATTERING; SEMICONDUCTOR; SURFACE PROPERTY; ULTRASTRUCTURE;

CARBOXYLIC ACIDS; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; FULLERENES; LIGHT; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; PHOTOCHEMISTRY; SCATTERING, RADIATION; SEMICONDUCTORS; SILVER; SURFACE PROPERTIES;

EID: 58149296350     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (38)

1. N. Shipway, E. Katz, and I. Willner, Chem. Phys. Chem. 1, 18 (2000).
2. R. P. Andres, J. D. Bielefeld, J. I. Henderson, D. B. Janes, Y. R. Kolagunta, C. P. Kubiak, W. J. Mahoney, and R. G. Osifchin, Science 273, 1690 (1996).
3. G. Schmidt, Chem. Rev. 92, 1709 (1992).
4. W. A. de Heer, Rev. Modern Phys. 65, 611 (1993).
5. K. Fukumi, A. Chayahara, K. Kadono, T. Sakaguchi, Y. Horino, M. Miya, K. Fujii, J. Hayakawa, and M. Satou, J. Appl. Phys. 75, 3075 (1994).
6. D. Sarkar and N. J. Halas, Appl. Phys. Lett. 63, 2438 (1993).
7. R. A. Ganeev, A. I. Ryasnyansky, M. K. Kodirov, and T. Usmanov, Opt. Commun. 185, 473 (2000).
8. K. Chou and C. Y. Ren, Mater. Chem. Phys. 64, 241 (2000).
9. C. Petit, P. Lixon, and M. P. Pilen, J. Phys. Chem. 97, 12974 (1993).
10. H. Zhang and K. Balasubramanian, Mol. Phys. 79, 727 (1993).
11. R. Schwedhelm, L. Kipp, A. Dallmeyer, and M. Skibowski, Phys. Rev. B 58, 13176 (1998).
12. A. P. Saab, M. Laub, V. I. Srdanov, and G. D. Stucky, Adv. Mater. 10, 462 (1998).
13. S. Hasegawa, T. Miyamae, K. Yakushi, H. Inokuchi, K. Seki, and N. Ueno, J. Electron Spectrosc. Relat. Phenom. 891, 88 (1998).
14. K. Nakamoto and M. A. McKinney, J. Chem. Ed. 11, 115 (2000).
15. A. Al-Mohamad and A. W. Allaf, Synth. Met. 104, 39 (1999).
16. P. V. Kamat, S. Barazzouk, K. G. Thomas, and S. Hotchandani, J. Phys. Chem. B 104, 4014 (2000).
17. Z. Niu and Y. Fang, Vibr. Spectrosc. 43, 415 (2007).
18. M. D. R. Taylor, P. Moriarty, B. N. Cotier, M. J. Butcher, P. H. Beton, and V. R. Dhanak, Appl. Phys. Lett. 77, 1144 (2000).
19. P. K. Sudeep, B. I. Ipe, K. George Thomas, M. V. George, S. Barazzouk, S. Hotchandani, and P. V. Kamat, Nano Lett. 2, 29 (2002).
20. Y. Li, Y. Huang, S. Du, and R. Liu, Chem. Phys. Lett. 335, 524 (2001).
21. Y. S. Jiang, C. G. Liu, and Y. H. Shao, Prog. Phys. 15, 307 (1995).
22. K. D. Gregory, L. M. Korst, P. Cane, L. D. Piatt, K. Kahn, P. M. Rafailov, V. G. Hadjiev, H. Jantoljak, and C. Thomsen, Solid State Commun. 112, 517 (1999).
23. J. Fagerström and S. Stafström, Phys. Rev. B 48, 367 (1993).
24. J. Visser and E. J. J. Groenen, Chem. Phys. Lett. 356, 43 (2002).
25. V. Meza-Laguna, E. V. Basiuk (Golovataya-Dzhymbeeva), E. Alvarez-Zauco, D. Acosta-Najarro, and V. A. Basiuk, J. Nanosci. Nanotechnol. 7, 3563 (2007).
26. N. L. Dmitruk, O. Yu. Borkovskaya, I. B. Mamontova, O. S. Kondratenko, D. O. Naumenko, E. V. Basiuk (Golovataya-Dzhymbeeva), and E. Alvarez-Zauco, Thin Solid Films 515, 7716 (2007).
27. R. Zanella, E. V. Basiuk, P. Santiago, V. A. Basiuk, E. Mireles, I. Puente-Lee, and J. M. Saniger, J. Phys. Chem. B 109, 16290 (2005).
28. F. Tang, X. Qiao, and J. Chen, Appl. Surf. Sci. 253, 703 (2006).
29. G. Guo-Cong, W. Quan-Ming, and T. C. W. Mak, J. Chem. Crystallogr. 29, 561, (1999).
30. T. Suzuki, Q. Li, K. C. Khemani, F. Wudl, and O. Almarsson, Science 254, 1186 (1991).
31. C. C. Henderson and P. A. Cahill, Science 259, 1885 (1993).
32. S. Kazaoui, N. Minami, Y. Tanabe, H. J. Byrne, A. Eilmes, and P. Petelenz, Phys. Rev. B 58, 7689 (1998).
33. R. W. Lof, M. A. van Veenendaal, B. Koopmans, H. T. Jonkman, and G. A. Sawatzky, Phys. Rev. Lett. 68, 3924 (1992).
34. B. Mishori, Y. Shapira, A. Belu-Marian, M. Manciu, and A. Devenyi, Chem. Phys. Lett. 264, 163 (1997).
35. U. D. Venkateswaran, D. Sanzi, A. M. Rao, P. C. Eklund, L. Marques, J.-L. Hodeau, and M. Nuñez-Regueiro, Phys. Rev. B 57, R3193 (1998).
36. Y. Wang, J. M. Holden, A. M. Rao, P. C. Eklund, U. D. Venkateswaran, D. Eastwood, R. L. Lidberg, G. Dresselhaus, and M. S. Dresselhaus, Phys. Rev. B 51, 4547 (1995).
37. V. A. Karachevtsev, A. Y. Glamazda, V. A. Pashinskaya, A. V. Peschanskii, A. M. Plokhotnichenko, and V. I. Fomin, J. Low Temp. Phys. 33, 704 (2007).
38. W. Guss, J. Feldman, E. O. Göbel, C. Taliani, H. Mohn, W. Müller, P. Haussier, and H.-U. ter Meer, Phys. Rev. Lett. 72, 2644 (1994).