Wettability inversion induced by weak electron irradiation

Journal of Applied Physics

Volumn 104, Issue 11, 2008, Pages

  Aronov, Daniel ^a   Molotskii, Michel ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CHEMICAL MODIFICATION; DIELECTRIC FILMS; DROPS; ELECTRONS; FLOW INTERACTIONS; HYDROPHILICITY; IRRADIATION; RADIATION; SEMICONDUCTING SILICON COMPOUNDS; SILICA; SURFACE TENSION; ULTRATHIN FILMS;

BASIC MECHANISMS; HYDROPHILIC STATES; IMAGE CHARGES; INTERFACE FREE ENERGIES; IRRADIATION DOSES; LIQUID/VAPOR INTERFACES; LOW DOSES; SEMI-CONDUCTORS; SILICON DIOXIDES; ULTRATHIN DIELECTRIC FILMS; ULTRATHIN OXIDE LAYERS; WATER DROPS; WATER MOLECULES;

ELECTRON IRRADIATION;

EID: 58149270795     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3035945     Document Type: Article

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