Automatic face alignment by maximizing similarity score

Proceedings of the 7th International Workshop on Pattern Recognition in Information Systems PRIS 2007; In Conjunction with ICEIS 2007

Volumn , Issue , 2007, Pages 221-230

  Boom, Bas ^a   Spreeuwers, Luuk ^a   Veldhuis, Raymond ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALIGNMENT; INFORMATION SYSTEMS; NAVIGATION; PATTERN RECOGNITION; PATTERN RECOGNITION SYSTEMS; TECHNICAL PRESENTATIONS;

FACE ALIGNMENTS; FACE RECOGNITION ALGORITHMS; FACE REGISTRATIONS; FACE VERIFICATIONS; OPTIMAL ALIGNMENTS; REGISTRATION METHODS; SIMILARITY SCORES;

FACE RECOGNITION;

EID: 58149267468     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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