Intense white photoluminescence emission of V-implanted zinc oxide thin films

Journal of Applied Physics

Volumn 104, Issue 12, 2008, Pages

  Müller, Sven ^a   Lorenz, Michael ^b   Czekalla, Christian ^b   Benndorf, Gabriele ^b   Hochmuth, Holger ^b   Grundmann, Marius ^b   Schmidt, Heidemarie ^c   Ronning, Carsten ^d  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b UNIVERSITY OF LEIPZIG   (Germany)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^d FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT EMISSION; LIGHT SOURCES; OXIDE FILMS; OXYGEN; PHOTOLUMINESCENCE; PULSED LASER APPLICATIONS; PULSED LASER DEPOSITION; SEMICONDUCTING ZINC COMPOUNDS; TRANSITION METALS; VANADIUM; VANADIUM ALLOYS; ZINC; ZINC OXIDE;

COLOR SPACES; FLUENCES; IMPLANTATION DEFECTS; ION ENERGIES; LUMINESCENCE BANDS; PULSED LASERS; REFERENCE SAMPLES; VANADIUM CONCENTRATIONS; VANADIUM IONS; VISIBLE SPECTRAL REGIONS; WHITE EMISSIONS; WHITE PHOTOLUMINESCENCES; ZINC OXIDE THIN FILMS; ZNO FILMS;

LUMINESCENCE;

EID: 58149266728     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3041652     Document Type: Article

References (65)

1. E. F. Schubert, Light-Emitting Diodes, 2nd ed. (Cambridge University Press, Cambridge, 2006).
2. S. Nakamura, Solid State Commun. 0038-1098 10.1016/S0038-1098(96)00722-3 102, 237 (1997).
3. S. Nakamura, Electron. Commun. Jpn., Part 2: Electron. 8756-663X 10.1002/(SICI)1520-6432(199805)81:5<1::AID-ECJB1>3.0.CO;2-P 81, 1 (1998).
4. E. W. Chase, R. T. Hepplewhite, D. C. Krupka, and D. Kahng, J. Appl. Phys. 0021-8979 10.1063/1.1658025 40, 2512 (1969).
5. W. M. Jadwisienczak, H. J. Lozykowski, I. Berishev, A. Bensaoula, and I. G. Brown, J. Appl. Phys. 0021-8979 10.1063/1.1357467 89, 4384 (2001).
6. H. J. Lozykowski, W. M. Jadwisienczak, and I. Brown, Appl. Phys. Lett. 0003-6951 10.1063/1.123465 74, 1129 (1999).
7. T. Monteiro, C. Boemare, M. J. Soares, E. Rita, and E. Alves, J. Appl. Phys. 0021-8979 10.1063/1.1573341 93, 8995 (2003).
8. U. Vetter, H. Hofsass, and T. Taniguchi, Appl. Phys. Lett. 0003-6951 10.1063/1.1753053 84, 4286 (2004).
9. Y. Narukawa, I. Niki, K. Izuno, M. Yamada, Y. Murazaki, and T. Mukai, Jpn. J. Appl. Phys., Part 2 0021-4922 10.1143/JJAP.41.L371 41, L371 (2002).
10. Landolt-Börnstein-Zahlenwerte und Funktionen aus Naturwissenschaften und Technik, Volume 22a: Halbleiter, edited by, O. Madelung, and, M. Schulz, (Springer-Verlag, Berlin, 1987).
11. C. Klingshirn, Phys. Status Solidi B 0370-1972 10.1002/pssb.200743072 244, 3027 (2007).
12. D. C. Reynolds, D. C. Look, B. Jogai, and H. Morkoc, Solid State Commun. 0038-1098 10.1016/S0038-1098(96)00697-7 101, 643 (1997).
13. X. L. Wu, G. G. Siu, C. L. Fu, and H. C. Ong, Appl. Phys. Lett. 0003-6951 10.1063/1.1361288 78, 2285 (2001).
14. P. S. Xu, Y. M. Sun, C. S. Shi, F. Q. Xu, and H. B. Pan, Chin. Phys. Lett. 0256-307X 10.1088/0256-307X/18/9/331 18, 1252 (2001).
15. F. H. Leiter, H. R. Alves, A. Hofstaetter, D. M. Hofmann, and B. K. Meyer, Phys. Status Solidi B 0370-1972 10.1002/1521-3951(200107)226:13.0.CO;2-F 226, R4 (2001).
16. F. Leiter, H. Alves, D. Pfisterer, N. G. Romanov, D. M. Hofmann, and B. K. Meyer, Physica B 340-342, 201 (2003). 0921-4526
17. K. Johnston, M. O. Henry, D. McCabe, E. McGlynn, M. Dietrich, E. Alves, and M. Xia, Phys. Rev. B 0163-1829 10.1103/PhysRevB.73.165212 73, 165212 (2006).
18. S. Müller, D. Stichtenoth, M. Uhrmacher, H. Hofsass, C. Ronning, and J. Roder, Appl. Phys. Lett. 0003-6951 10.1063/1.2430483 90, 012107 (2007).
19. X. L. Guo, J. -H. Choi, H. Tabata, and T. Kawai, Jpn. J. Appl. Phys., Part 2 0021-4922 10.1143/JJAP.40.L177 40, L177 (2001).
20. I. E. Titkov, A. S. Zubrilov, L. A. Delimova, D. V. Mashovets, I. A. Liniichuk, and I. V. Grekhov, Semiconductors 1063-7826 10.1134/S106378260705017X 41, 564 (2007).
21. M. Diaconu, H. Schmidt, H. Hochmuth, M. Lorenz, H. von Wenckstern, G. Biehne, D. Spemann, and M. Grundmann, Solid State Commun. 0038-1098 10.1016/j.ssc.2005.12.028 137, 417 (2006).
22. J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1999).
23. H. von Wenckstern, E. M. Kaidashev, M. Lorenz, H. Hochmuth, G. Biehne, J. Lenzner, V. Gottschalch, R. Pickenhain, and M. Grundmann, Appl. Phys. Lett. 0003-6951 10.1063/1.1638898 84, 79 (2004).
24. B. K. Meyer, H. Alves, D. M. Hofmann, W. Kriegseis, D. Forster, F. Bertram, J. Christen, A. Hoffmann, M. Straßburg, M. Dworzak, U. Haboeck, and A. V. Rodina, Phys. Status Solidi B 0370-1972 10.1002/pssb.200301962 241, 231 (2004).
25. R. B. Bylsma, W. M. Becker, J. Kossut, U. Debska, and D. Yodershort, Phys. Rev. B 0163-1829 10.1103/PhysRevB.33.8207 33, 8207 (1986).
26. S. V. Bhat and F. L. Deepak, Solid State Commun. 0038-1098 10.1016/j.ssc.2005.05.051 135, 345 (2005).
27. M. Schumm, M. Koerdel, J. F. Morhange, Z. Golacki, K. Grasza, P. Skupinski, W. Szuszkiewicz, H. Zhou, V. Malik, H. Kalt, C. Klingshirn, and J. Geurts, J. Phys.: Conf. Ser. 1742-6588 10.1088/1742-6596/92/1/012149 92, 012149 (2007).
28. S. Q. Zhou, K. Potzger, J. von Borany, R. Grotzschel, W. Skorupa, M. Helm, and J. Fassbender, Phys. Rev. B 0163-1829 10.1103/PhysRevB.77.035209 77, 035209 (2008).
29. S. Q. Zhou, K. Potzger, H. Reuther, G. Talut, F. Eichhorn, J. von Borany, W. Skorupa, M. Helm, and J. Fassbender, J. Phys. D 0022-3727 10.1088/0022-3727/40/4/007 40, 964 (2007).
30. A. Zeuner, H. Alves, J. Sann, W. Kriegeis, C. Neumann, D. M. Hofmann, B. K. Meyer, A. Hoffman, U. Haboeck, M. Straßburg, and A. Kaschner, Phys. Status Solidi C 1, 731 (2004). 1610-1634
31. A. F. Kohan, G. Ceder, D. Morgan, and C. G. Van De Walle, Phys. Rev. B 0163-1829 10.1103/PhysRevB.61.15019 61, 15019 (2000).
32. Q. X. Zhao, P. Klason, M. Willander, H. M. Zhong, W. Lu, and J. H. Yang, Appl. Phys. Lett. 0003-6951 10.1063/1.2135880 87, 211912 (2005).
33. B. T. Adekore, R. F. Davis, and D. W. Barlage, J. Appl. Phys. 0021-8979 10.1063/1.2409745 101, 024902 (2007).
34. S. A. Studenikin, N. Golego, and M. Cocivera, J. Appl. Phys. 0021-8979 10.1063/1.368295 84, 2287 (1998).
35. H. von Wenckstern, G. Benndorf, S. Heitsch, J. Sann, M. Brandt, H. Schmidt, J. Lenzner, M. Lorenz, A. Y. Kuznetsov, B. K. Meyer, and M. Grundmann, Appl. Phys. A: Mater. Sci. Process. 88, 125 (2007).
36. A. Poppl and G. Volkel, Phys. Status Solidi A 125, 571 (1991). 0031-8965
37. K. Vanheusden, C. H. Seager, W. L. Warren, D. R. Tallant, and J. A. Voigt, Appl. Phys. Lett. 0003-6951 10.1063/1.116699 68, 403 (1996).
38. K. Vanheusden, W. L. Warren, C. H. Seager, D. R. Tallant, J. A. Voigt, and B. E. Gnade, J. Appl. Phys. 0021-8979 10.1063/1.362349 79, 7983 (1996).
39. D. Pfisterer, D. M. Hofmann, J. Sann, B. K. Meyer, R. Tena-Zaera, V. Munoz-Sanjose, T. Frank, and G. Pensl, Physica B 376-377, 767 (2006). 0921-4526
40. T. Frank, G. Pensl, R. Tena-Zaera, J. Zuniga-Perez, C. Martinez-Tomas, V. Munoz-Sanjose, T. Ohshima, H. Itoh, D. Hofmann, D. Pfisterer, J. Sann, and B. Meyer, Appl. Phys. A: Mater. Sci. Process. 0947-8396 10.1007/s00339-007-3963-3 88, 141 (2007).
41. D. M. Hofmann, D. Pfisterer, J. Sann, B. K. Meyer, R. Tena-Zaera, V. Munoz-Sanjose, T. Frank, and G. Pensl, Appl. Phys. A: Mater. Sci. Process. 0947-8396 10.1007/s00339-007-3956-2 88, 147 (2007).
42. J. P. Gambino, W. D. Kingery, G. E. Pike, H. R. Philipp, and L. M. Levinson, J. Appl. Phys. 0021-8979 10.1063/1.337934 61, 2571 (1987).
43. Y. Yano, Y. Takai, and H. Morooka, J. Mater. Res. 9, 112 (1994). 0884-2914
44. R. Dingle, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.23.579 23, 579 (1969).
45. R. Kuhnert and R. Helbig, J. Lumin. 0022-2313 10.1016/0022-2313(81)90182- 4 26, 203 (1981).
46. I. Broser, R. Germer, A. Schroder, E. Birkicht, and R. Broser, J. Lumin. 24-25, 225 (1981). 0022-2313
47. N. Y. Garces, L. Wang, L. Bai, N. C. Giles, L. E. Halliburton, and G. Cantwell, Appl. Phys. Lett. 0003-6951 10.1063/1.1494125 81, 622 (2002).
48. M. Deicher, Physica B 389, 51 (2007). 0921-4526
49. D. C. Reynolds, D. C. Look, and B. Jogai, J. Appl. Phys. 0021-8979 10.1063/1.1356432 89, 6189 (2001).
50. T. Ogino and M. Aoki, Jpn. J. Appl. Phys. 0021-4922 10.1143/JJAP.19.2395 19, 2395 (1980).
51. M. A. Reshchikov, F. Shahedipour, R. Y. Korotkov, B. W. Wessels, and M. P. Ulmer, J. Appl. Phys. 0021-8979 10.1063/1.372348 87, 3351 (2000).
52. Q. Li, S. J. Xu, M. H. Xie, and S. Y. Tong, Europhys. Lett. 0295-5075 10.1209/epl/i2005-10170-7 71, 994 (2005).
53. C. F. Klingshirn, Semiconductor Optics (Springer-Verlag, Berlin, 1997).
54. U. Wahl, E. Rita, J. G. Correia, E. Alves, and J. G. Soares, Phys. Rev. B 0163-1829 10.1103/PhysRevB.69.012102 69, 012102 (2004).
55. E. Rita, U. Wahl, J. G. Correia, E. Alves, and J. C. Soares, Appl. Phys. Lett. 0003-6951 10.1063/1.1825611 85, 4899 (2004).
56. A. Janotti and C. G. Van de Walle, J. Cryst. Growth 0022-0248 10.1016/j.jcrysgro.2005.10.043 287, 58 (2006).
57. Y. M. Sun and H. Z. Wang, Physica B 0921-4526 10.1016/S0921-4526(02) 01517-X 325, 157 (2003).
58. R. Heitz, A. Hoffmann, B. Hausmann, and I. Broser, J. Lumin. 48-49, 689 (1991). 0022-2313
59. L. S. Vlasenko, G. D. Watkins, and R. Helbig, Phys. Rev. B 0163-1829 10.1103/PhysRevB.71.115205 71, 115205 (2005).
60. Th. Agne, M. Dietrich, J. Hamann, S. Lany, H. Wolf, Th. Wichert, and ISOLDE Collaboration, Appl. Phys. Lett. 0003-6951 10.1063/1.1576912 82, 3448 (2003).
61. Y. Zhang and W. Ge, J. Lumin. 0022-2313 10.1016/S0022-2313(99)00193-3 85, 247 (2000).
62. W. D. Wright, The Measurement of Colour, 4th ed. (Adam Hilger, London, 1969).
63. D. L. MacAdam, Color Measurement, 2nd ed. (Springer, Berlin, 1985).
64. M. Grundmann, The Physics of Semiconductors (Springer, Berlin, 2006).
65. B. Fortner and T. E. Meyer, Number by Colors (Springer-Verlag, New York, 1997).