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Volumn 79, Issue 12, 2008, Pages
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A scanning Hall probe microscope for high resolution magnetic imaging down to 300 mK
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Author keywords
[No Author keywords available]
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Indexed keywords
EXCAVATION;
GARNETS;
HELIUM;
MICROSCOPES;
NIOBIUM;
SCANNING TUNNELING MICROSCOPY;
SIGNAL PROCESSING;
SILICATE MINERALS;
SPACE PROBES;
SUPERCONDUCTING MAGNETS;
TUNNELS;
YTTRIUM;
YTTRIUM ALLOYS;
YTTRIUM COMPOUNDS;
ALGAAS/INGAAS/GAAS;
CLOSE PROXIMITIES;
DOMAIN PATTERNS;
HALL PROBES;
HALL SENSORS;
HALL SIGNALS;
HIGH RESOLUTIONS;
IN-SITU;
LATERAL RESOLUTIONS;
MAGNETIC IMAGING;
MAGNETIC INDUCTIONS;
NANOPOSITIONER;
OXFORD INSTRUMENTS;
PROBE LOCATIONS;
ROOM TEMPERATURES;
SAMPLE SURFACES;
SCANNING RANGES;
SCANNING TUNNEL MICROSCOPIES;
SUB MICRONS;
SUPERCONDUCTING VORTICES;
TRACKING MODES;
TUNNEL CURRENTS;
YTTRIUM IRON GARNETS;
SCANNING;
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EID: 58149252741
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3046285 Document Type: Article |
Times cited : (22)
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References (6)
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