Reachability graph-based test sequence generation for concurrent programs

International Journal of Software Engineering and Knowledge Engineering

Volumn 18, Issue 6, 2008, Pages 803-822

  Wong, W Eric ^a   Lei, Yu ^b  

^a The University of Texas at Dallas   (United States)

^b The University of Texas at Arlington   (United States)

Author keywords

All edge criterion; All node criterion; Concurrent program testing; Reachability graph; Structural testing

Indexed keywords

IMAGE SEGMENTATION; TEST FACILITIES; TESTING;

ALL-EDGE CRITERION; ALL-NODE CRITERION; CONCURRENT PROGRAM TESTING; REACHABILITY GRAPH; STRUCTURAL TESTING;

CONCURRENCY CONTROL;

EID: 58149252250     PISSN: 02181940     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218194008003878     Document Type: Article

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