Mapping a stripe rust resistance gene YrC591 in wheat variety C591 with SSR and AFLP markers

Theoretical and Applied Genetics

Volumn 118, Issue 2, 2009, Pages 339-346

  Li, Y ^a,b   Niu, Y C ^a   Chen, X M ^c  

^a INSTITUTE OF PLANT PROTECTION   (China)

^b INSTITUTE OF MEDICINAL PLANT DEVELOPMENT   (China)

^c WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFLP MARKERS; BULK SEGREGANT ANALYSES; DESTRUCTIVE DISEASES; DOMINANT GENES; GENETIC ANALYSES; GENETIC DISTANCES; GENOTYPING; PUCCINIA STRIIFORMIS; REACTION PATTERNS; RESISTANCE GENES; SCAR MARKERS; SSR MARKERS; STRIPE RUSTS; TRITICUM AESTIVUM; WHEAT CULTIVARS; WHEAT VARIETIES;

CHROMOSOMES; GRAIN (AGRICULTURAL PRODUCT); LINGUISTICS; PLANTS (BOTANY); SEMICONDUCTOR RELAYS;

GENETIC ENGINEERING;

AMPLIFIED FRAGMENT LENGTH POLYMORPHISM; ARTICLE; CHROMOSOME MAP; GENETIC LINKAGE; GENETIC MARKER; GENETIC POLYMORPHISM; GENETICS; PHYSIOLOGY; PLANT CHROMOSOME; PLANT DISEASE; PLANT GENE; VARIABLE NUMBER OF TANDEM REPEAT; WHEAT;

AMPLIFIED FRAGMENT LENGTH POLYMORPHISM ANALYSIS; CHROMOSOME MAPPING; CHROMOSOMES, PLANT; GENES, PLANT; GENETIC MARKERS; LINKAGE (GENETICS); MINISATELLITE REPEATS; PLANT DISEASES; POLYMORPHISM, GENETIC; TRITICUM;

PUCCINIA STRIIFORMIS; TRITICUM AESTIVUM;

EID: 58149242195     PISSN: 00405752     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00122-008-0903-3     Document Type: Article

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