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Volumn 76, Issue 3, 2008, Pages 347-367

Basic process capability indices: An expository review

Author keywords

Autocorrelation; Measurement error; Nonnormality; Sample size; Skewed distributions

Indexed keywords


EID: 58149232754     PISSN: 03067734     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1751-5823.2008.00060.x     Document Type: Review
Times cited : (35)

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