Growth and characterization of BLZT-CFO composite thin films

Materials Chemistry and Physics

Volumn 113, Issue 2-3, 2009, Pages 702-706

  Delgado, E ^a,b,c   Ostos, C ^b   Martinez Sarrion M L ^b   Mestres, L ^b   Lederman, D ^c   Prieto, P ^a  

^a UNIVERSIDAD DEL VALLE   (Colombia)

^b UNIVERSITY OF BARCELONA   (Spain)

^c WEST VIRGINIA UNIVERSITY   (United States)

Author keywords

Composite materials; Magnetron sputtering; Thin films

Indexed keywords

BARIUM; COMPOSITE FILMS; COMPOSITE MATERIALS; COMPOSITE MICROMECHANICS; FERROELECTRIC FILMS; FERROELECTRICITY; FILMS; MAGNETIC FIELDS; MAGNETRONS; NIOBIUM; OXIDE MINERALS; OXYGEN; PEROVSKITE; PHOTOELECTRON SPECTROSCOPY; PLATINUM; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SOLIDS; SUBSTRATES; THIN FILMS; X RAY ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIUM;

COMPOSITE THIN FILMS; CONSTITUENT ELEMENTS; DEPTH PROFILES; EXTERNAL MAGNETIC FIELDS; FERROELECTRIC POLARIZATIONS; HIGH OXYGEN PRESSURES; MIXED TARGETS; PEROVSKITE STRUCTURES; ROOM TEMPERATURES; SI SUBSTRATES; SUBSTRATE TEMPERATURES; X-RAY DIFFRACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

MAGNETIC THIN FILMS;

EID: 58149154815     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2008.07.131     Document Type: Article

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