Collision strengths for electron scattering from Si II

Astrophysical Journal, Supplement Series

Volumn 179, Issue 2, 2008, Pages 534-541

  Tayal, S S ^a  

^a CLARK ATLANTA UNIVERSITY   (United States)

Author keywords

Atomic data; Atomic processes

Indexed keywords

EID: 58149129335     PISSN: 00670049     EISSN: None     Source Type: Journal    
DOI: 10.1086/591849     Document Type: Article

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