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Volumn , Issue , 2003, Pages 168-173

Behavioural modelling and simulation of ΣΔ modulators using hardware description languages

Author keywords

[No Author keywords available]

Indexed keywords

BEHAVIOURAL MODELLING; BEHAVIOURAL SIMULATIONS; BUILDING BLOCKES; CIRCUIT NON-IDEALITIES; ELECTRICAL SIMULATION; FOURTH-ORDER; MULTI-BITS;

EID: 58149125876     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2003.1253604     Document Type: Conference Paper
Times cited : (3)

References (11)
  • 1
    • 0002379498 scopus 로고
    • Oversampling methods for a/d and d/a conversion
    • IEEE Press
    • J. Candy and G.C. Temes, ?Oversampling Methods for A/D and D/A Conversion,? in Oversampling converters, pp. 1-25, IEEE Press, 1992.
    • (1992) Oversampling Converters , pp. 1-25
    • Candy, J.1    Temes, G.C.2
  • 3
    • 0026998539 scopus 로고
    • Design tools for oversampling data converters: Needs and solutions
    • V. F. Dias, V. Liberali and F. Maloberti: ?Design Tools for Oversampling Data Converters: Needs and Solutions?, Microelectronics Journal, Vol. 23, pp. 641-650, 1992.
    • (1992) Microelectronics Journal , vol.23 , pp. 641-650
    • Dias, V.F.1    Liberali, V.2    Maloberti, F.3
  • 5
    • 0027667249 scopus 로고
    • Tosca: A simulator for switched-capacitor noise-shaping a/d converters
    • Sept.
    • V. Liberali, V.F. Dias, M. Ciapponi and F. Maloberti, ?TOSCA: A Simulator for Switched-capacitor Noise-shaping A/D Converters,? IEEE Trans. Computer-Aided Design, Vol. 12, No. 9, pp. 1376-1386, Sept. 1993.
    • (1993) IEEE Trans. Computer-Aided Design , vol.12 , Issue.9 , pp. 1376-1386
    • Liberali, V.1    Dias, V.F.2    Ciapponi, M.3    Maloberti, F.4
  • 6
    • 0030108451 scopus 로고    scopus 로고
    • Sampled data simulation of linear and nonlinear circuits
    • March
    • A. Opal: ?Sampled Data Simulation of Linear and Nonlinear Circuits?, IEEE Trans. on Computer-Aided Design, Vol. 15, pp. 295-306, March 1996.
    • (1996) IEEE Trans. on Computer-Aided Design , vol.15 , pp. 295-306
    • Opal, A.1
  • 11
    • 0033884138 scopus 로고    scopus 로고
    • Reliable analysis of settling errors in sc integrators: Application to modulators
    • March
    • R del Río, F. Medeiro, B. Pérez-Verdú and A Rodríguez-Vázquez ?Reliable Analysis of Settling Errors in SC Integrators: Application to Modulators,? IEE Electronics Letters, pp. 503-504, Vol. 36 Iss. 6, March 2000.
    • (2000) IEE Electronics Letters , vol.36 , Issue.6 , pp. 503-504
    • Del Río, R.1    Medeiro, F.2    Pérez-Verdú, B.3    Rodríguez-Vázquez, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.