Insulation defect localization through partial discharge measurements and numerical classification

IEEE International Symposium on Industrial Electronics

Volumn 1, Issue , 2004, Pages 417-422

  Pöyhönen, Sanna ^a   Conti, Marco ^b   Cavallini, Andrea ^b   Montanari, Gian C ^b   Filippetti, Fiorenzo ^b  

^a AALTO UNIVERSITY   (Finland)

^b UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Defect localization; Insulation systems; Partial discharges; Support vector machine

Indexed keywords

CLASSIFICATION METHODS; CONDITION BASED MAINTENANCE; DEFECT LOCALIZATION; DEFECT LOCALIZATIONS; DEFECT LOCATION; ELECTRICAL INSULATION; FUNDAMENTAL TOOLS; INSULATION DEFECTS; INSULATION SYSTEMS; K-NEAREST NEIGHBOR CLASSIFIER; NUMERICAL CLASSIFICATION; PARTIAL DISCHARGE ANALYSIS; PARTIAL DISCHARGE MEASUREMENTS; PROBABILISTIC NEURAL NETWORKS; STATISTICAL ANALYSIS;

CLASSIFIERS; DEFECTS; ELECTRODES; IMAGE RETRIEVAL; INDUSTRIAL APPLICATIONS; INDUSTRIAL ELECTRONICS; NEURAL NETWORKS; RISK ASSESSMENT; RISK MANAGEMENT; SUPPORT VECTOR MACHINES;

PARTIAL DISCHARGES;

EID: 58149118658     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIE.2004.1571844     Document Type: Conference Paper

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