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Volumn , Issue , 2008, Pages 91-95

Anomaly detection in electronic products

Author keywords

Anomalous behavior; Field returned electronics; Intermittent behavior; Mahalanobis distance

Indexed keywords

ANOMALOUS BEHAVIOR; ANOMALY DETECTIONS; CASE STUDIES; ELECTRONIC PRODUCTS; ELECTRONICS MANUFACTURERS; FIELD RETURNED ELECTRONICS; INTERMITTENT BEHAVIOR; MAHALANOBIS; MAHALANOBIS DISTANCE; ROOT CAUSES;

EID: 58149090338     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESTC.2008.4684330     Document Type: Conference Paper
Times cited : (3)

References (10)
  • 1
    • 43049154693 scopus 로고    scopus 로고
    • No-fault-found and Intermittent Failures in Electronic Product
    • May
    • Qi, H., Ganesan, S., and Pecht, M., "No-fault-found and Intermittent Failures in Electronic Product," Microelectronics Reliability, Vol. 48, Issue 5, pp. 663-674, May 2008.
    • (2008) Microelectronics Reliability , vol.48 , Issue.5 , pp. 663-674
    • Qi, H.1    Ganesan, S.2    Pecht, M.3
  • 3
    • 58149087108 scopus 로고    scopus 로고
    • An Onboard Diagnostic System for PC Re-Vse Analysis
    • Vienna, Austria, 12-16 November
    • Hickey, S., and Fitzpatrick, C., "An Onboard Diagnostic System for PC Re-Vse Analysis," Care Innovation, Electronics Goes Green, Vienna, Austria, 12-16 November 2006.
    • (2006) Care Innovation, Electronics Goes Green
    • Hickey, S.1    Fitzpatrick, C.2
  • 6
    • 0942266453 scopus 로고    scopus 로고
    • Load Characterization During Transportation
    • January
    • Ramakrishnan, A., and Pecht, M., "Load Characterization During Transportation," Microeletronics Reliability., Vol. 44, No. 2, pp. 333-338, January 2004
    • (2004) Microeletronics Reliability , vol.44 , Issue.2 , pp. 333-338
    • Ramakrishnan, A.1    Pecht, M.2
  • 7
    • 13444256234 scopus 로고    scopus 로고
    • In Situ Temperature Measurement of a Notebook Computer-A Case Study in Health and Usage Monitoring of Electronics
    • December
    • Vichare, N., Rodgers, P., and Pecht, M., "In Situ Temperature Measurement of a Notebook Computer-A Case Study in Health and Usage Monitoring of Electronics," IEEE Transactions on Device and Materials Reliability, Vol. 4, No. 4, December 2004.
    • (2004) IEEE Transactions on Device and Materials Reliability , vol.4 , Issue.4
    • Vichare, N.1    Rodgers, P.2    Pecht, M.3
  • 8
    • 0003410791 scopus 로고    scopus 로고
    • Third Edition, Springer, New York, NY
    • Kohonen, T., "Self-Organizing Maps," Third Edition, Springer, New York, NY, 2001.
    • (2001) Self-Organizing Maps
    • Kohonen, T.1
  • 10
    • 58349097101 scopus 로고    scopus 로고
    • Health Monitoring of Electronic Products Using Symbolic Time Series Analysis
    • Arlington, VA, November
    • Kumar, S. and Pecht M., "Health Monitoring of Electronic Products Using Symbolic Time Series Analysis," AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp. 50-57, Arlington, VA, November 2007.
    • (2007) AAAI Fall Symposium on Artificial Intelligence for Prognostics , pp. 50-57
    • Kumar, S.1    Pecht, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.