A high-precision optical polarimeter to measure inclinations of high-mass X-ray binaries

Publications of the Astronomical Society of the Pacific

Volumn 120, Issue 874, 2008, Pages 1282-1297

  Wiktorowicz, Sloane J ^a,b   Matthews, Keith ^c  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c California Institute of Technology

Author keywords

[No Author keywords available]

Indexed keywords

EID: 58049198034     PISSN: 00046280     EISSN: None     Source Type: Journal    
DOI: 10.1086/595966     Document Type: Article

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