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Volumn 468, Issue 1-2, 2009, Pages 150-153

The 773 K isothermal section of the ternary phase diagram of the Nb-Ti-Si system

Author keywords

Metals and alloys; Phase diagrams; Scanning electron microscopy; SEM; X ray diffraction

Indexed keywords

DIFFRACTION; ELECTRON MICROSCOPES; ISOTHERMS; METALLIC COMPOUNDS; METALLURGY; NIOBIUM; NIOBIUM ALLOYS; NIOBIUM COMPOUNDS; PHASE DIAGRAMS; SCANNING; SCANNING ELECTRON MICROSCOPY; SILICON; SOLID SOLUTIONS; SOLUBILITY; TERNARY ALLOYS; TERNARY SYSTEMS; TITANIUM COMPOUNDS; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EID: 58049196738     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.01.009     Document Type: Article
Times cited : (11)

References (20)
  • 7
    • 0035196424 scopus 로고    scopus 로고
    • Hemker K., Dimiduk D.M., Clemens H., Darolia R., Inui H., Larsen J.M., Sikka V.K., Thomas M., and Whittenberger J.D. (Eds), TMS, Warrendale, PA
    • Zhao J.-C., Bewlay B.P., Jackson M.R., and Peluso L.A. In: Hemker K., Dimiduk D.M., Clemens H., Darolia R., Inui H., Larsen J.M., Sikka V.K., Thomas M., and Whittenberger J.D. (Eds). Structural Intermetallics (2001), TMS, Warrendale, PA 483-491
    • (2001) Structural Intermetallics , pp. 483-491
    • Zhao, J.-C.1    Bewlay, B.P.2    Jackson, M.R.3    Peluso, L.A.4
  • 14
    • 58049212193 scopus 로고    scopus 로고
    • Jade 5.0, XRD Pattern Processing Materials Data Inc., 1999.
    • Jade 5.0, XRD Pattern Processing Materials Data Inc., 1999.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.