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Volumn 57, Issue 3, 2009, Pages 673-681
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Deposition and characterization of superhard biphasic ruthenium boride films
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Author keywords
AFM; Hardness; Pulsed laser deposition; Ruthenium borides film; X ray diffraction
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
BORIDES;
COMPOSITE FILMS;
DIFFRACTION;
HARDNESS;
LASERS;
PULSED LASER APPLICATIONS;
PULSED LASER DEPOSITION;
RHENIUM;
RUTHENIUM;
X RAY ANALYSIS;
X RAY DIFFRACTION;
AFM;
BIPHASIC;
CRYSTALLITE GROWTHS;
DIBORIDE;
FILM DEPOSITIONS;
FILM HARDNESSES;
GRAIN TEXTURES;
PREFERRED ORIENTATIONS;
SUBSTRATE SYSTEMS;
SUPER HARDNESSES;
SUPERHARD;
TWO PHASES;
VICKERS MICRO HARDNESSES;
FILM PREPARATION;
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EID: 58049192924
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2008.10.009 Document Type: Article |
Times cited : (38)
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References (26)
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