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Volumn 57, Issue 3, 2009, Pages 673-681

Deposition and characterization of superhard biphasic ruthenium boride films

Author keywords

AFM; Hardness; Pulsed laser deposition; Ruthenium borides film; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; BORIDES; COMPOSITE FILMS; DIFFRACTION; HARDNESS; LASERS; PULSED LASER APPLICATIONS; PULSED LASER DEPOSITION; RHENIUM; RUTHENIUM; X RAY ANALYSIS; X RAY DIFFRACTION;

EID: 58049192924     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.10.009     Document Type: Article
Times cited : (38)

References (26)
  • 10
    • 58049212316 scopus 로고    scopus 로고
    • Felici R, Cilloco F, Caminiti R, Sadun C, Rossi V. Italian Patent RM 93 A 000410.
    • Felici R, Cilloco F, Caminiti R, Sadun C, Rossi V. Italian Patent RM 93 A 000410.
  • 22
    • 58049210190 scopus 로고    scopus 로고
    • International Centre for Diffraction Data, Powder Diffraction File 2, Database JCPDS CARDs: 73-1243, 75-2103.
    • International Centre for Diffraction Data, Powder Diffraction File 2, Database JCPDS CARDs: 73-1243, 75-2103.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.