Interaction forces between hydrophobic surfaces evaluated by AFM - The role of nanoscopic bubbles in the interactions

Australasian Institute of Mining and Metallurgy Publication Series

Volumn , Issue , 2005, Pages 481-486

  Ishida, N ^a   Higashitani, K ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; COUPLING AGENTS; DIES; FLOTATION; HYDROPHOBICITY; ORGANIC COMPOUNDS; ORGANIC SOLVENTS; SILANES; SILICA; SURFACE CHEMISTRY; VAN DER WAALS FORCES;

AFM IMAGES; AQUEOUS SOLUTIONS; ATOMIC FORCE MICROSCOPES; ATTRACTIVE FORCES; CRITICAL EFFECTS; DLVO THEORIES; DOMAIN STRUCTURES; FORCE CURVES; GAS PHASE; HYDROPHOBIC ATTRACTIONS; HYDROPHOBIC SURFACES; IMMERSION TIMES; INTERACTION FORCES; NANOBUBBLE; REPULSIVE FORCES; SILANE COUPLING AGENTS; SILICA PARTICLES; SILICON PLATES; TAPPING MODES;

FLOW INTERACTIONS;

EID: 58049189006     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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