Distortion calibration of the MISR linear detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2820, Issue , 1996, Pages 174-183

  Korechoff, R ^a   Kirby, D ^a   Hochberg, E ^a   Sepulveda, C ^a   Jovanovic, V ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Calibration; Distortion; EOS; MISR

Indexed keywords

CALIBRATION; CAMERAS; CHARGE COUPLED DEVICES; DISTORTION (WAVES);

DISTORTION CALIBRATION; FLIGHT CONDITIONS; HARDWARE AND SOFTWARE; LINEAR DETECTORS; MISR; SPECTRAL FILTERS; SPECTRO-RADIOMETERS; TEMPERATURE RANGE;

PIXELS;

EID: 58049180088     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.258099     Document Type: Conference Paper

References (0)