Density functional theory study of the near edge X-ray absorption fine structure and infrared spectroscopy of acetylene and benzene on group IV semiconductor surfaces

Surface Science

Volumn 603, Issue 1, 2009, Pages 158-164

  Asmuruf, Frans A ^a   Besley, Nicholas A ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

Acetylene; Benzene; DFT; Infrared spectroscopy; NEXAFS

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; ACETYLENE; ATOMIC PHYSICS; ATOMS; BENZENE; ELECTROMAGNETIC WAVE ABSORPTION; ENERGY ABSORPTION; GERMANIUM; INFRARED SPECTROSCOPY; LIGHTING; OPTICAL SENSORS; PROBABILITY DENSITY FUNCTION; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; X RAY ABSORPTION;

ABSORPTION FINE STRUCTURES; CARBON ATOMS; CORRELATION FUNCTIONAL; DENSITY FUNCTIONAL THEORY CALCULATIONS; DFT; NEXAFS; SEMICONDUCTOR SURFACES; SINGLE BONDS; SPECTRAL FEATURES; STRETCHING FREQUENCIES; TIME DEPENDENTS; VIBRATIONAL MODES;

DENSITY FUNCTIONAL THEORY;

EID: 58049161496     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.10.043     Document Type: Article

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