Sub-μHz MOSFET 1/f noise measurements

Electronics Letters

Volumn 45, Issue 1, 2009, Pages 81-82

  Mandal, S ^a   Arfin, S K ^a   Sarpeshkar, R ^a  

^a Department of Electrical Engineering and Computer Science   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

POWER SPECTRUM;

1/F NOISES; CANCELLATION TECHNIQUES; COMMON-MODE NOISES; EFFECTS OF TEMPERATURES; GAUSSIAN AMPLITUDE DISTRIBUTIONS; MOS FETS; NMOS TRANSISTORS;

THERMAL EFFECTS;

EID: 58049106836     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20092638     Document Type: Article

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