Nearest feature line: A tangent approximation

Proceedings of the 2008 Chinese Conference on Pattern Recognition, CCPR 2008

Volumn , Issue , 2008, Pages 67-72

  He, Ran ^a   Ao, Meng ^a   Xiang, Shi Ming ^a   Li, Stan Z ^a  

^a INSTITUTE OF AUTOMATION   (China)

Author keywords

Face recognition; Nearest feature classifier; Nearest feature line; Tangent distance

Indexed keywords

CLASSIFIERS; COMPUTATIONAL COMPLEXITY; ELECTRIC NETWORK ANALYSIS; LEARNING SYSTEMS; PATTERN RECOGNITION; POLYNOMIAL APPROXIMATION;

CLASSIFICATION ABILITIES; CLASSIFICATION METHODS; EUCLIDEAN DISTANCES; FEATURE SPACES; MANIFOLD ANALYSES; MANIFOLD DISTANCES; NEAREST FEATURE CLASSIFIER; NEAREST FEATURE LINE; SIMILARITY MEASURES; SYNTHETIC DATASET; TANGENT DISTANCE; THEORETICAL ANALYSES;

FACE RECOGNITION;

EID: 57949104678     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CCPR.2008.22     Document Type: Conference Paper

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