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Volumn 58, Issue 1, 2009, Pages 87-93

Four-terminal-pair inductance comparison between INRIM and CTU

Author keywords

Electric variables measurement; Impedance measurement; Inductors

Indexed keywords

CAPACITANCE; CAPACITORS; DIELECTRIC DEVICES; ELECTRIC EQUIPMENT; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC RESISTANCE MEASUREMENT; ELECTRIC VARIABLES MEASUREMENT; INDUCTANCE; MEASUREMENT THEORY; MEASUREMENTS; PORT TERMINALS; RESISTORS; STANDARDS; STATISTICAL METHODS;

EID: 57949085877     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.928402     Document Type: Conference Paper
Times cited : (13)

References (17)
  • 1
    • 0002414811 scopus 로고
    • Four-terminal-pair networks as precision admittance and impedance standards
    • Jan
    • R. D. Cutkosky, "Four-terminal-pair networks as precision admittance and impedance standards," Commun. Electron., vol. 70, pp. 19-22, Jan. 1964.
    • (1964) Commun. Electron , vol.70 , pp. 19-22
    • Cutkosky, R.D.1
  • 2
    • 0036066822 scopus 로고    scopus 로고
    • EUROMET Project 432: Frequency performance of 12 906 Ω and 6453 Ω reference resistors for ac quantum Hall effect experiments
    • J. Boháček, "EUROMET Project 432: Frequency performance of 12 906 Ω and 6453 Ω reference resistors for ac quantum Hall effect experiments," Metrologia, vol. 39, no. 2, pp. 231-237, 2002.
    • (2002) Metrologia , vol.39 , Issue.2 , pp. 231-237
    • Boháček, J.1
  • 3
    • 34648852037 scopus 로고    scopus 로고
    • Four terminal pair concepts
    • Nov./Dec
    • R. Calhoun, "Four terminal pair concepts," Cal Lab, pp. 38-41, Nov./Dec. 1996.
    • (1996) Cal Lab , pp. 38-41
    • Calhoun, R.1
  • 4
    • 0036393545 scopus 로고    scopus 로고
    • Inductance calibration in the frequency range from 50 Hz to 1 MHz at PTB
    • Tech. Dig, Ottawa, ON, Canada, Jun. 16-21
    • R. Hanke, A. Kölling, and J. Melcher, "Inductance calibration in the frequency range from 50 Hz to 1 MHz at PTB," in CPEM Tech. Dig., Ottawa, ON, Canada, Jun. 16-21, 2002, pp. 186-187.
    • (2002) CPEM , pp. 186-187
    • Hanke, R.1    Kölling, A.2    Melcher, J.3
  • 5
    • 57949111756 scopus 로고    scopus 로고
    • B. P. Kibble, Four terminal-pair to anything else! in Proc. IEE Colloq. Interconnections From DC Microw. Ref. No. 1999/019 , London, U.K., Feb. 18, 1999, pp. 6/1-6/6.
    • B. P. Kibble, "Four terminal-pair to anything else!" in Proc. IEE Colloq. Interconnections From DC Microw. (Ref. No. 1999/019 , London, U.K., Feb. 18, 1999, pp. 6/1-6/6.
  • 6
    • 57949102761 scopus 로고    scopus 로고
    • L. Callegaro, EUROMET.EM-S20: Intercomparison of a 100 mH inductance standard (Euromet Project 607), Metrologia, 44, Tech. Supp., 01002.
    • L. Callegaro, "EUROMET.EM-S20: Intercomparison of a 100 mH inductance standard (Euromet Project 607)," Metrologia, vol. 44, Tech. Supp., 01002.
  • 7
    • 34648819387 scopus 로고    scopus 로고
    • Four terminal-pair inductance comparison between INRIM and CTU
    • Warsaw, Poland, May 1-3
    • L. Callegaro, V. D'Elia, and J. Boháček, "Four terminal-pair inductance comparison between INRIM and CTU," in Proc. IMTC, Warsaw, Poland, May 1-3, 2007, pp. 1-5.
    • (2007) Proc. IMTC , pp. 1-5
    • Callegaro, L.1    D'Elia, V.2    Boháček, J.3
  • 8
  • 9
    • 0015430844 scopus 로고
    • An evaluation of the three-voltmeter method for ac power measurement
    • Nov
    • L. A.Marzetta, "An evaluation of the three-voltmeter method for ac power measurement," IEEE Trans. Instrum. Meas., vol. IM-21, no. 4, pp. 353-357, Nov. 1972.
    • (1972) IEEE Trans. Instrum. Meas , vol.IM-21 , Issue.4 , pp. 353-357
    • Marzetta, L.A.1
  • 10
    • 0035720944 scopus 로고    scopus 로고
    • Automated system for inductance realization traceable to ac resistance with a three-voltmeter method
    • Dec
    • L. Callegaro and V. D'Elia, "Automated system for inductance realization traceable to ac resistance with a three-voltmeter method," IEEE Trans. Instrum. Meas., vol. 50, no. 6, pp. 1630-1633, Dec. 2001.
    • (2001) IEEE Trans. Instrum. Meas , vol.50 , Issue.6 , pp. 1630-1633
    • Callegaro, L.1    D'Elia, V.2
  • 11
    • 0033687991 scopus 로고    scopus 로고
    • AC QHE-based resistance and capacitance calibrations
    • Jul
    • J. Boháček, "AC QHE-based resistance and capacitance calibrations," Proc. Inst. Elect. Eng. - Sci. Meas. Technol., vol. 147, no. 4, pp. 190-192, Jul. 2000.
    • (2000) Proc. Inst. Elect. Eng. - Sci. Meas. Technol , vol.147 , Issue.4 , pp. 190-192
    • Boháček, J.1
  • 12
    • 4043104030 scopus 로고    scopus 로고
    • A QHE-based system for calibrating impedance standards
    • Aug
    • J. Boháček, "A QHE-based system for calibrating impedance standards," IEEE Trans. Instrum. Meas., vol. 53, no. 4, pp. 977-980, Aug. 2004.
    • (2004) IEEE Trans. Instrum. Meas , vol.53 , Issue.4 , pp. 977-980
    • Boháček, J.1
  • 13
    • 34648841972 scopus 로고    scopus 로고
    • Calibration of inductance standards
    • Tech. Dig, London, U.K
    • J. Boháček and R. Sedláèek, "Calibration of inductance standards," in CPEM Tech. Dig., London, U.K., 2004, pp. 37-38.
    • (2004) CPEM , pp. 37-38
    • Boháček, J.1    Sedláèek, R.2
  • 14
    • 34648850020 scopus 로고    scopus 로고
    • Calibrating standards of self- and mutual inductance
    • Rio de Janeiro, Brazil
    • J. Boháček, "Calibrating standards of self- and mutual inductance," in Proc. VI Semetro, Rio de Janeiro, Brazil, 2005, pp. 42-44.
    • (2005) Proc. VI Semetro , pp. 42-44
    • Boháček, J.1
  • 15
    • 0036388645 scopus 로고    scopus 로고
    • 100 mH travelling standard for the EUROMET 607 pilot intercomparison
    • Tech. Dig, Ottawa, ON, Canada, Jun. 16-21
    • L. Callegaro, V. D'Elia, F. Francone, and D. Serazio, "100 mH travelling standard for the EUROMET 607 pilot intercomparison," in CPEM Tech. Dig., Ottawa, ON, Canada, Jun. 16-21, 2002, pp. 352-353.
    • (2002) CPEM , pp. 352-353
    • Callegaro, L.1    D'Elia, V.2    Francone, F.3    Serazio, D.4
  • 16
    • 4043166379 scopus 로고    scopus 로고
    • Guide to the Expression of Uncertainty in Measurement, Supplement 1, Numerical Methods for the Propagation of Distributions
    • Joint Committee for Guides in Metrology/Working Group 1, In preparation
    • Joint Committee for Guides in Metrology/Working Group 1, Guide to the Expression of Uncertainty in Measurement, Supplement 1, Numerical Methods for the Propagation of Distributions. In preparation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.