The sodium diffusion in aluminium-oxide

Applied Surface Science

Volumn 255, Issue 6, 2009, Pages 3581-3585

  Lovas, H ^a,b   Josepovits, V K ^b   Toth Z ^a  

^a GE Hungary Co Ltd   (Hungary)

^b BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

Author keywords

Bulk diffusion coefficient; Grain boundary diffusion coefficient; SIMS; Single crystal and polycrystalline alumina; Sodium diffusion; XPS

Indexed keywords

ACTIVATION ENERGY; ALUMINA; ALUMINUM OXIDE; CERAMIC MATERIALS; GRAIN BOUNDARIES; SECONDARY ION MASS SPECTROMETRY; SINGLE CRYSTALS; SODIUM ALUMINATE; SODIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

BULK DIFFUSION COEFFICIENTS; CONCENTRATION-DEPTH PROFILE; GRAIN-BOUNDARY DIFFUSION; HIGH INTENSITY DISCHARGE LAMPS; POLYCRYSTALLINE ALUMINA; POLYCRYSTALLINE CERAMICS; SECONDARY ION MASS SPECTROSCOPIES (SIMS); TEMPERATURE DEPENDENCIES;

DIFFUSION;

EID: 57849165434     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.10.001     Document Type: Article

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