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Volumn , Issue , 2008, Pages 222-226

A linear sampling approach to crack detection in microwave imaging

Author keywords

[No Author keywords available]

Indexed keywords

CRACK DETECTION; DIGITAL IMAGE STORAGE; MICROWAVES; OPTOELECTRONIC DEVICES; TECHNICAL PRESENTATIONS;

EID: 57849153473     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IST.2008.4659973     Document Type: Conference Paper
Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.