Automated extraction of expert knowledge in analog topology selection and sizing

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2008, Pages 392-395

  McConaghy, Trent ^a,b   Palmers, Pieter ^a   Gielen, Georges ^a   Steyaert, Michiel ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b Solido Design Automation Inc Canada   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; DECISION THEORY; DECISION TREES; ELECTRIC NETWORK TOPOLOGY; EXTRACTIVE METALLURGY; MATHEMATICAL MODELS; OPERATIONAL AMPLIFIERS; SENSITIVITY ANALYSIS; TOPOLOGY; TREES (MATHEMATICS);

ANALYTICAL EXPRESSIONS; AUTOMATED EXTRACTIONS; CIRCUIT TOPOLOGIES; DATA-MINING; EXPERT KNOWLEDGES; NONLINEAR SENSITIVITY ANALYSIS; OPTIMAL DESIGNS; PERFORMANCE SPECIFICATIONS; PERFORMANCE TRADEOFFS; PROCESS NODES;

DESIGN;

EID: 57849130314     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2008.4681603     Document Type: Conference Paper

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