Melting and cavity growth in the vicinity of crack tips subjected to short-duration current pulses

IEEE Transactions on Magnetics

Volumn 45, Issue 1, 2009, Pages 584-586

  Gallo, F ^a   Satapathy, S ^b   Ravi Chandar, K ^a  

^a The University of Texas at Austin   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

Crack growth; Short duration current pulse

Indexed keywords

CRACK PROPAGATION; ELECTROMAGNETIC LAUNCHERS; HIGH SPEED PHOTOGRAPHY; MELTING;

CURRENT CARRYING CONDUCTORS; FUNCTION OF TIME; HIGH CURRENTS; LOCALIZED MELTING; MECHANICAL AND ELECTRICAL; RAIL MATERIAL; SHORT-DURATION CURRENT PULSE; SURFACE CRACKS;

CRACK TIPS;

EID: 57849104667     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2008.2008572     Document Type: Article

References (2)

1. S. Satapathy, F. Stefani, and A. Saenz, "Crack tip behavior under pulsed electromagnetic loading," IEEE Trans. Magn., vol. 41, pp. 226-230, 2005.
2. G. G. S. Doelp, "Experimental and Numerical Analysis of Electric Currents and Electromagnetic Blunting of Cracks in Thin Plates," 1984.