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Applied Physics Letters

Volumn 93, Issue 24, 2008, Pages

Peculiar effect of mechanical stress on polarization stability in micrometer-scale ferroelectric capacitors

(3) Gruverman, A a Cross, J S b Oates, W S c

a UNIVERSITY OF NEBRASKA LINCOLN (United States)

b TOKYO INSTITUTE OF TECHNOLOGY (Japan)

c FLORIDA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITORS; DIELECTRIC DEVICES; ELECTRIC EQUIPMENT; ELECTRIC FIELDS; FERROELECTRIC DEVICES; FERROELECTRICITY; LEAD; MICROMETERS; POLARIZATION; PULSE TIME MODULATION; STRESSES; THICKNESS MEASUREMENT; ZIRCONIUM;

APPLIED ELECTRIC FIELDS; APPLIED FIELDS; BACKSWITCHING; CENTRAL REGIONS; DOMAIN PATTERNS; DRIVING FORCES; ELECTRODE THICKNESSES; EQUILIBRIUM POLARIZATIONS; FERROELECTRIC CAPACITORS; FERROELECTRIC PHASE; FINITE ELEMENTS; INDUCED POLARIZATIONS; MECHANICAL STRESSES; MICROMETER SIZES; PIEZORESPONSE FORCE MICROSCOPIES; POLARIZATION STABILITIES; RETENTION BEHAVIORS; SPONTANEOUS POLARIZATIONS; TRANSIENT RESPONSES;

ELECTROLYTIC CAPACITORS;

EID: 57849100111 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3046734 Document Type: Article

Times cited : (26)

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