Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels

IEEE Communications Letters

Volumn 12, Issue 11, 2008, Pages 822-824

  Slatanov, Nikola ^a   Hadzi Velkov, Zoran ^a   Karagiannidis, George K ^b  

^a Methodius University

^b ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

Average fade duration (AFD); Cascaded fading; Keyhole MIMO fading channels; Level crossing rate (LCR); Multiplicative fading; Nakagami m fading

Indexed keywords

AVERAGE FADE DURATION (AFD); CASCADED FADING; KEYHOLE MIMO FADING CHANNELS; LEVEL CROSSING RATE (LCR); MULTIPLICATIVE FADING; NAKAGAMI-M FADING;

CELLULAR RADIO SYSTEMS; CHANNEL CAPACITY; CROSSINGS (PIPE AND CABLE); FADING (RADIO); MATHEMATICAL MODELS; MIM DEVICES; MULTIPLEXING; PROGRAMMING THEORY; RAILROAD CROSSINGS; RANDOM PROCESSES;

FADING CHANNELS;

EID: 57849096800     PISSN: 10897798     EISSN: None     Source Type: Journal    
DOI: 10.1109/LCOMM.2008.081058     Document Type: Article

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