An optimal data center availability and investment trade-offs

Proc. 9th ACIS Int. Conf. Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, SNPD 2008 and 2nd Int. Workshop on Advanced Internet Technology and Applications

Volumn , Issue , 2008, Pages 712-719

  Wiboonrat, Montri ^a  

^a ASSUMPTION UNIVERSITY   (Thailand)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; COMMERCE; COSTS; ELECTRIC LOAD DISTRIBUTION; ELECTRIC POWER DISTRIBUTION; ELECTRIC POWER SYSTEMS; INTERNET; INVESTMENTS; LOCAL AREA NETWORKS; METAL RECOVERY; QUALITY ASSURANCE; REDUNDANCY; RELIABILITY THEORY; SATELLITE COMMUNICATION SYSTEMS; SOFTWARE ENGINEERING; SYSTEMS ENGINEERING; TECHNICAL PRESENTATIONS;

BUSINESS ACTIVITIES; BUSINESS OPERATIONS; COMPONENT VENDORS; DATA CENTERS; FIELD TEST DATUMS; INVESTMENT COSTS; MECHANICAL COMPONENTS; OPTIMAL BALANCES; OPTIMAL DATUMS; OVERALL SYSTEMS; PARALLEL DESIGNS; POWER DISTRIBUTION SYSTEMS; POWER OUTAGES; REAL CASES; RECOVERY TIMES; REDUNDANCY SCHEMES; RELIABILITY BLOCK DIAGRAMS; RELIABILITY INFORMATIONS; SYSTEM FAILURES; SYSTEM RELIABILITIES;

RELIABILITY;

EID: 57749173437     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SNPD.2008.121     Document Type: Conference Paper

References (17)

1. APC, "Effect of UPS on System Availability, White Paper #24", Revision 2, American Power Conversion, 2004.
2. B. Boehm, L. Huang, A. Jain, and R. Madachy, "The ROI of Software Dependability The iDAVE Model", IEEE Software, May/June 2004. pp. 54-61.
3. R. Bono, A. Alexander, A. Dorman, YJ. Kim, and J. Reisdorf, "Analyzing Reliability - A Simple Yet Rigorous Approach", IEEE Trans. Ind. Applicat, Vol. 40, No. 4, July./Aug. 2004, pp. 950-957.
4. HRG, Harvard Research Group, Inc. Harvard, P.O. Box 297 MA 01451-0297 USA, http://www.hrgresearch.com/pdf/paper4.pdf, 2007.
5. IEEE Std. 493-1997, Design of Reliable Industrial and Commercial Power Systems, Gold Book, 1997.
6. Kembel, R., Fiber Channel: A Comprehensive Introduction, 2000.
7. D. O. Koval, L. Jiao, R. G. Arno, and P. S. Hale, Jr., "Zone-Branch Reliability Methodology Applied to Gold Book Stand Network", IEEE Trans. Ind. Applicat., Vol. 38, No. 4, July./Aug. 2002, pp. 990-995.
8. D. O. Koval, X. Zhang, J. Propst, T. Coyle, R. Arno, and R. S. Hale, JR., "Reliability Methodologies Applied to THE IEEE GOLD BOOK STANDARD NETWORK", IEEE Ind. Applicat. Magazine, Jan./Feb. 2003, pp. 32-41.
9. D. A. Patterson, "A Simple Way to Estimate the Cost of Downtime", The Proceedings of LISA '02: Sixteeth Systems Administration Conference, Berkeley, CA: USENIX Association, 2002.
10. A. Pievatolo, E. Tironi, and I. Valade, "Sime-Markov Processes for Power System Reliability Assessment With Application to Uninterruptible Power Supply", IEEE Trans. Power Sys., vol. 19, no. 3, August 2004. pp. 1326-1333.
11. U. D. Pra, D. Baert, H. Kuyken, "Analysis of The Degree of Reliability of A Redundant Modular Inverter Structure", ieeexplore.ieee.org/ie15/6413/17135/00793592.pdf, 1998.
12. B. Roczen, R. G. Arno, and P. S. Hale, "Reliability Block Diagram Methodology Applied to Gold Book Standard Network", IEEE Industrial and Commercial Power Systems Technical Conference, 2-6 May 2004, pp. 116-126.
13. W. P. Turner, J. H. Seader, K. G. Brill, "Tier Classifications Define Site Infrastructure Performance", The Uptime Institute, Inc. 2006. www.uptimeinstitute.org
14. W. P. Turner, K. G. Brill, "Industry Standard Tier Classifications Define Site Infrastructure Performance", Uptime Institute Inc. 2007.
15. W. Vahlstrom, "A PRACTICAL GUIDE for ELECTRICAL RELIABILITY", EC&M, October 2004, pp. 48-53.
16. W. Wang, J. M. Loman, R. G. Arno, E. R. Furlong, and D. Ogden, "Reliability Block Diagram Simulation Techniques Applied to the IEEE Std. 493 Standard Network", IEEE Trans. Ind. Applicat, Vol. 40, No. 3, May/June 2004, pp. 887-895.
17. W. Wang, E. R. Furlong, R. G. Armo, P. Vassiliou, and D. Ogden, "Apply Simulation Technique via Reliability Block Diagram to Gold Book Standard Networks", IEEE, 0-7803-7771-0/03, 2003.