IPS mode investigation of liquid crystal alignment on organic hybrid overcoat layer via ion beam irradiation

Liquid Crystals

Volumn 35, Issue 12, 2008, Pages 1373-1377

  Ok, Chul Ho ^a   Kim, Byoung Yong ^a   Oh, Byeong Yun ^a   Kim, Young Hwan ^a   Lee, Kang Min ^a   Park, Hong Gyu ^a   Han, Jeong Min ^a   Seo, Dae Shik ^a   Lee, Dong Ki ^b   Hwang, Jeong Yeon ^c  

^a Yonsei University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

^c KENT STATE UNIVERSITY   (United States)

Author keywords

Ion beam irradiation; IPS mode; Liquid crystal alignment; Organic hybrid overcoat; XPS analysis

Indexed keywords

EID: 57749120391     PISSN: 02678292     EISSN: 13665855     Source Type: Journal    
DOI: 10.1080/02678290802617716     Document Type: Article

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