Extending microarray quality control and analysis algorithms to illumina chip platform

Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings

Volumn , Issue , 2007, Pages 4637-4640

  Stokes, Todd H ^b   Han, Xiao ^c   Moffitt, Richard A ^c   Wang, May D ^a,c  

^a IEEE

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^c EMORY UNIVERSITY   (United States)

Author keywords

Artifact removal; Illumina microarray; Quality control

Indexed keywords

ALGORITHMS; BIOTECHNOLOGY; GENES; PROTEINS; QUALITY CONTROL;

ARTIFACT REMOVAL; ILLUMINA CHIP PLATFORM; ILLUMINA MICROARRAYS;

MICROARRAYS;

ARTICLE; COMPUTER PROGRAM; COMPUTER SIMULATION; DNA MICROARRAY; EQUIPMENT; GENE EXPRESSION PROFILING; GENE EXPRESSION REGULATION; METHODOLOGY; RANDOMIZATION; SELECTION BIAS; SENSITIVITY AND SPECIFICITY;

COMPUTER SIMULATION; GENE EXPRESSION PROFILING; GENE EXPRESSION REGULATION; OLIGONUCLEOTIDE ARRAY SEQUENCE ANALYSIS; RANDOM ALLOCATION; SELECTION BIAS; SENSITIVITY AND SPECIFICITY; SOFTWARE;

EID: 57649243979     PISSN: 05891019     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEMBS.2007.4353373     Document Type: Conference Paper

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