Controlling of e-beam trajectory by tapered macro-gate for various field emission applications

IDW '06 - Proceedings of the 13th International Display Workshops

Volumn 3, Issue , 2006, Pages 1853-1855

  Jeong, Jin Woo ^a   Kim, Dae Jun ^a   Oh, Jeong Seob ^a   Song, Yoon Ho ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; FIELD EMISSION; MACROS; REFRACTORY METAL COMPOUNDS; TECHNICAL PRESENTATIONS;

ANODE VOLTAGES; BEAM SPREADING; BEAM TRAJECTORIES; CARBON NANO TUBES; CNT EMITTERS; FIELD EMITTERS; GATE ELECTRODES; GATE HOLES;

FIELD EMISSION DISPLAYS;

EID: 57649240260     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. J.-W. Jeong, Y.-H. Song, D.-J. Kim, S.-H. Lee, J. H. Lee, and K.-Y. Kang, IDW 2005, Proceedings of the 12th IDW, p. 1683 (2005).
2. M.-C. Hsiao, Y.-Y. Chang, W.-Y. Lin, L.-Y. Jiang, M.-H. Lin, L.-H. Chan, Y.-C. Jiang, T.-H. Tsou, and C.-C. Lee. SID 2006, Digest of Technical Papers, p. 71 (2006).
3. Y.-H. Song, J.-W. Jeong, D.-J. Kim, J. H. Lee, K.-Y. Kang, SID 2006, Digest of Technical Papers, p. 1849 (2006).