Nonstoichiometry and transport properties of Ca3 Co4±x O9+δ (x=0-0.4)

Electrochemical and Solid-State Letters

Volumn 12, Issue 2, 2009, Pages

  Zhou, X D ^a   Pederson, L R ^a   Thomsen, E ^a   Nie, Z ^a   Coffey, G ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ELEMENTS; CIVIL AVIATION; COBALT COMPOUNDS; DEFECT DENSITY; ELECTRIC CONDUCTIVITY; GRAVIMETRIC ANALYSIS; OXYGEN; THERMOGRAVIMETRIC ANALYSIS; TRANSPORT PROPERTIES; VACANCIES;

BASE-LINES; CARRIER DENSITIES; DEFECT CHEMISTRIES; ELECTRICAL CONDUCTIVITIES; HOLE CARRIERS; LAYERED STRUCTURES; NON STOICHIOMETRIES; REACTION PRODUCTS; REDOX COUPLES; ROOM TEMPERATURES; VALENCE STATES;

OXYGEN VACANCIES;

EID: 57649227288     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3039948     Document Type: Article

References (22)

1. I. Terasaki, Y. Sasago, and K. Uchinokura, Phys. Rev. B, 56, R12685 (1997).
2. J. H. Yang and T. Caillat, MRS Bull., 31, 224 (2006).
3. T. M. Tritt and M. A. Subramanian, MRS Bull., 31, 188 (2006).
4. A. C. Masset, C. Michel, A. Maignan, M. Hervieu, O. Toulemonde, F. Studer, B. Raveau, and J. Hejtmanek, Phys. Rev. B, 62, 166 (2000).
5. R. Funahashi, I. Matsubara, H. Ikuta, T. Takeuchi, U. Mizutani, and S. Sodeoka, Jpn. J. Appl. Phys., Part 2, 39, L1127 (2000).
6. P. Limelette, S. Hebert, V. Hardy, R. Fresard, C. Simon, and A. Maignan, Phys. Rev. Lett., 97, 046601 (2006).
7. A. Maignan, S. Hebert, M. Hervieu, C. Michel, D. Pelloquin, and D. Khomskii, J. Phys.: Condens. Matter, 15, 2711 (2003).
8. P. Limelette, J. C. Soret, H. Muguerra, and D. Grebille, Phys. Rev. B, 77, 245123 (2008).
9. X. D. Zhou, Q. Cai, J. Yang, M. Kim, W. B. Yelon, W. J. James, Y. W. Shin, B. J. Scarfino, and H. U. Anderson, J. Appl. Phys., 97, 10C314 (2005).
10. X. D. Zhou, L. R. Pederson, Q. Cai, J. Yang, B. J. Scarfino, M. Kim, W. B. Yelon, W. J. James, H. U. Anderson, and C. Wang, J. Appl. Phys., 99, 08M918 (2006).
11. X. D. Zhou, J. B. Yang, E. C. Thomsen, Q. Cai, B. J. Scarfino, Z. Nie, G. W. Coffey, W. J. James, W. B. Yelon, H. U. Anderson, J. Electrochem. Soc., 153, J133 (2006).
12. L. A. Chick, L. R. Pederson, G. D. Maupin, J. L. Bates, L. E. Thomas, and G. J. Exarhos, Mater. Lett., 10, 6 (1990).
13. E. Woermann and A. Muan, J. Inorg. Nucl. Chem., 32, 1455 (1970).
14. J. D. Jorgensen, B. Dabrowski, S. Pei, D. R. Richards, and D. G. Hinks, Phys. Rev. B, 40, 2187 (1989).
15. F. A. Kroger and H. J. Vink, in Solid State Physics-Advances in Research and Applications, Vol. 3, F. Seitz, and, T. Turnbull, Editors, pp. 307-435, Academic, New York (1957).
16. X. D. Zhou, W. Huebner, and H. U. Anderson, in Defects and Diffusion in Ceramics: An Annual Retrospective Vii, Vol. 242-244, pp. 277-289, Trans Tech Publications, Ltd, Zurich-Uetikon (2005).
17. X. D. Zhou and W. Huebner, Appl. Phys. Lett., 79, 3512 (2001).
18. J. B. Yang, W. B. Yelon, W. J. James, Z. Chu, M. Kornecki, Y. X. Xie, X. D. Zhou, H. U. Anderson, A. G. Joshi, and S. K. Malik, Phys. Rev. B, 66, 184415 (2002).
19. S. Sakamoto, M. Yoshinaka, K. Hirota, and O. Yamaguchi, J. Am. Ceram. Soc., 80, 267 (1997).
20. N. Van Nong and M. Ohtaki, Solid State Commun., 139, 232 (2006).
21. J. Takahashi, M. Shimada, K. Iwasaki, and H. Yaname, J. Electroceram., 17, 95 (2006).
22. O. Levy and D. J. Bergman, J. Phys. A, 25, 1875 (1992).