High speed and sensitivity array tester for LTPS LCD and OLED

IDW '06 - Proceedings of the 13th International Display Workshops

Volumn 2, Issue , 2006, Pages 897-900

  Chikamatsu, K ^a   Miyake, Y ^a   Fujisaki, T ^a   Goto, M ^a   Mizoguchi, J ^a  

^a YOKOGAWA ANALYTICAL SYSTEMS INC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INSPECTION; LIQUID CRYSTAL DISPLAYS; ORGANIC LIGHT EMITTING DIODES (OLED); TECHNICAL PRESENTATIONS;

DEFECT DETECTION CAPABILITIES; HIGH SPEEDS; TEST SOLUTIONS;

HELMET MOUNTED DISPLAYS;

EID: 57649156255     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. T. Matsuo, et al., SID'04 Digest, p856(2004)
2. Y. Nakajima, et al., SID'04 Digest, p864(2004)
3. http://www.oled-info.com/newsArchive/Januar y2006.html
4. K. Chikamatsu, et al., IMID/IDMC'06 Digest, p1447 (2006)
5. S. W. Tam, Ph.D thesis, Cambridge univ.(1994)
6. J. W. Hamer, et al., SID'05 Digest, p1902 (2005)