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Volumn 66, Issue SUPPL. 1, 1998, Pages

A study of metal films using a spectrally resolved photonmap obtained by spectrummapping measurements of STM-induced light

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN MORPHOLOGIES; GRAPHITE SURFACES; HIGH EMISSION INTENSITY; INTENSIFIED CHARGE COUPLED DEVICES; INTENSITY IMAGES; LUMINESCENCE SPECTRUM; METAL FILM; METAL PARTICLE; NANO SCALE; SCANNING TUNNELING MICROSCOPY (STM); SHORTER WAVELENGTH; SPECTRAL BAND; SPECTRAL MAPPINGS; TOPOGRAPHY IMAGES;

EID: 57649138151     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051117     Document Type: Article
Times cited : (8)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.