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Volumn 66, Issue SUPPL. 1, 1998, Pages
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A study of metal films using a spectrally resolved photonmap obtained by spectrummapping measurements of STM-induced light
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Author keywords
[No Author keywords available]
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Indexed keywords
GRAIN MORPHOLOGIES;
GRAPHITE SURFACES;
HIGH EMISSION INTENSITY;
INTENSIFIED CHARGE COUPLED DEVICES;
INTENSITY IMAGES;
LUMINESCENCE SPECTRUM;
METAL FILM;
METAL PARTICLE;
NANO SCALE;
SCANNING TUNNELING MICROSCOPY (STM);
SHORTER WAVELENGTH;
SPECTRAL BAND;
SPECTRAL MAPPINGS;
TOPOGRAPHY IMAGES;
CHARGE COUPLED DEVICES;
DIGITAL CAMERAS;
LIGHT;
LUMINESCENCE;
PHOTOMAPPING;
PHOTONS;
WIND TUNNELS;
SCANNING TUNNELING MICROSCOPY;
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EID: 57649138151
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s003390051117 Document Type: Article |
Times cited : (8)
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References (14)
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