Reading resistor values by color image processing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3185, Issue , 1997, Pages 157-168

  Chan, Kap Luk ^a   Wang, Han ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Automated surface inspection; Color image processing; Recognition

Indexed keywords

COLOR; COLOR IMAGE PROCESSING; DIGITAL IMAGE STORAGE; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGING SYSTEMS; INSPECTION; INSTRUMENTS; RESISTORS;

AUTOMATED SURFACE INSPECTION; BAYES CLASSIFIERS; COLOR BOUNDARIES; COLOR IMAGES; COLOR RECOGNITIONS; COLOR REGIONS; COLOR SPACES; NON CONTACTS; RECOGNITION; RELIABLE RECOGNITIONS; TWO COLORS;

OPTICAL PROPERTIES;

EID: 57649136822     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.284040     Document Type: Conference Paper

References (5)

1. Kap Luk Chan, Jiancheng Jia and Qiang Wu, "Fast In-process Machine Vision Inspection of Reel-pack Resistors", Proceedings of International Conference on Robotics, Vision and Parallel Processing for Industrial Automation, pp. 198-203, Malaysia, May 26-28, 1994
2. Thorell and W.J. Smith, Using Computer Color Effectively, Prentice Hall, 1990.
3. William K Pratt, Digital Image Processing, Wiley Press, 1991.
4. Gonzalez RC and Woods, Digital Image Processing, Addison Wesley, 1977, pp45-89, pp221-249.
5. Yihong Gong , "An Effective Method for Detecting Regions of Given Colors & Features of the Region Surfaces", Image & Video Processing II SPIE Vol.2182 pp274-281.